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Performance enhancement of ITO/oxide/semiconductor MOS-structure silicon solar cells with voltage biasing

机译:偏置电压增强ITO /氧化物/半导体MOS结构硅太阳能电池的性能

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摘要

In this study, we demonstrate the photovoltaic performance enhancement of a p-n junction silicon solar cell using a transparent-antireflective ITO/oxide film deposited on the spacing of the front-side finger electrodes and with a DC voltage applied on the ITO-electrode. The depletion width of the p-n junction under the ITO-electrode was induced and extended while the absorbed volume and built-in electric field were also increased when the biasing voltage was increased. The photocurrent and conversion efficiency were increased because more photo-carriers are generated in a larger absorbed volume and because the carriers transported and collected more effectively due to higher biasing voltage effects. Compared to a reference solar cell (which was biased at 0 V), a conversion efficiency enhancement of 26.57% (from 12.42% to 15.72%) and short-circuit current density enhancement of 42.43% (from 29.51 to 42.03 mA/cm2) were obtained as the proposed MOS-structure solar cell biased at 2.5 V. In addition, the capacitance-volt (C-V) measurement was also used to examine the mechanism of photovoltaic performance enhancement due to the depletion width being enlarged by applying a DC voltage on an ITO-electrode.
机译:在这项研究中,我们演示了使用沉积在正面指状电极间距上的透明抗反射ITO /氧化物膜以及在ITO电极上施加直流电压来增强p-n结硅太阳能电池的光伏性能。当偏置电压增加时,在ITO电极下p-n结的耗尽宽度被诱导并延长,同时吸收体积和内置电场也增加。之所以增加光电流和转换效率,是因为在更大的吸收体积中产生了更多的光载流子,并且由于较高的偏置电压效应,使载流子更有效地传输和收集。与参考太阳能电池(偏置为0V)相比,转换效率提高了26.57%(从12.42%提高到15.72%),短路电流密度提高了42.43%(从29.51提高到42.03mA / cm 2 )是由于所建议的MOS结构太阳能电池的偏置电压为2.5V。此外,电容-伏特(CV)测量还用于检验耗尽层宽度导致光伏性能增强的机制通过在ITO电极上施加直流电压来扩大尺寸。

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