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Seed/Catalyst-Free Growth of Gallium-Based Compound Materials on Graphene on Insulator by Electrochemical Deposition at Room Temperature

机译:绝缘层上石墨烯在室温下的电化学沉积无籽/无催化剂生长镓基复合材料

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摘要

We report the growth of gallium-based compounds, i.e., gallium oxynitride (GaON) and gallium oxide (Ga2O3) on multilayer graphene (MLG) on insulator using a mixture of ammonium nitrate (NH4NO3) and gallium nitrate (Ga(NO3)3) by electrochemical deposition (ECD) method at room temperature (RT) for the first time. The controlling parameters of current density and electrolyte molarity were found to greatly influence the properties of the grown structures. The thicknesses of the deposited structures increase with the current density since it increases the chemical reaction rates. The layers grown at low molarities of both solutions basically show grain-like layer with cracking structures and dominated by both Ga2O3 and GaON. Such cracking structures seem to diminish with the increases of molarities of one of the solutions. It is speculated that the increase of current density and ions in the solutions helps to promote the growth at the area with uneven thicknesses of graphene. When the molarity of Ga(NO3)3 is increased while keeping the molarity of NH4NO3 at the lowest value of 2.5 M, the grown structures are basically dominated by the Ga2O3 structure. On the other hand, when the molarity of NH4NO3 is increased while keeping the molarity of Ga(NO3)3 at the lowest value of 0.8 M, the GaON structure seems to dominate where their cubic and hexagonal arrangements are coexisting. It was found that when the molarities of Ga(NO3)3 are at the high level of 7.5 M, the grown structures tend to be dominated by Ga2O3 even though the molarity of NH4NO3 is made equal or higher than the molarity of Ga(NO3)3. When the grown structure is dominated by the Ga2O3 structure, the deposition process became slow or unstable, resulting to the formation of thin layer. When the molarity of Ga(NO3)3 is increased to 15 M, the nanocluster-like structures were formed instead of continuous thin film structure. This study seems to successfully provide the conditions in growing either GaON-dominated or Ga2O3-dominated structure by a simple and low-cost ECD. The next possible routes to convert the grown GaON-dominated structure to either single-crystalline GaN or Ga2O3 as well as Ga2O3-dominated structure to single-crystalline Ga2O3 structure have been discussed.
机译:我们报告了使用硝酸铵(NH4NO3)和硝酸镓(Ga(NO3)3)的混合物在绝缘体上的多层石墨烯(MLG)上生长基于镓的化合物,即氧氮化镓(GaON)和氧化镓(Ga2O3)首次在室温(RT)下通过电化学沉积(ECD)方法进行。发现电流密度和电解质摩尔浓度的控制参数极大地影响了生长结构的性能。沉积结构的厚度随电流密度而增加,因为它增加了化学反应速率。在两种溶液的低摩尔浓度下生长的层基本上显示出具有裂纹结构的晶粒状层,并以Ga 2 O 3和GaON为主。随着一种溶液的摩尔浓度的增加,这种破裂结构似乎减少了。据推测,溶液中电流密度和离子的增加有助于促进石墨烯厚度不均匀的区域的生长。当增加Ga(NO3)3的摩尔浓度同时将NH4NO3的摩尔浓度保持在最低值2.5 M时,生长的结构基本上由Ga2O3结构主导。另一方面,当在保持Ga(NO 3 3 的最低浓度为0.8 M的同时增加NH4NO3的摩尔浓度时,GaON结构似乎在它们的立方和六边形排列共存的地方占主导地位。发现当Ga(NO 3 3 的摩尔浓度处于7.5 M的高水平时,生长的结构倾向于由Ga 2控制 O 3 ,即使使NH 4 NO 3 的摩尔浓度等于或高于Ga(NO 3 3 。当生长的结构以Ga 2 O 3 结构为主时,沉积过程变得缓慢或不稳定,导致形成薄层。当Ga(NO 3 3 的摩尔浓度增加到15 M时,形成的是纳米簇状结构,而不是连续的薄膜结构。这项研究似乎为通过简单且低成本的ECD生长以GaON为主或Ga 2 O 3 为主的结构提供了条件。将生长的GaON为主的结构转换为单晶GaN或Ga 2 O 3 以及Ga 2 O的下一条可能途径讨论了以 3 为主导的单晶Ga 2 O 3 结构。

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