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Detection of pH and Enzyme-Free H2O2 Sensing Mechanism by Using GdOx Membrane in Electrolyte-Insulator-Semiconductor Structure

机译:电解质-绝缘体-半导体结构中使用GdOx膜检测pH和无酶H2O2的感应机理

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摘要

A 15-nm-thick GdOx membrane in an electrolyte-insulator-semiconductor (EIS) structure shows a higher pH sensitivity of 54.2 mV/pH and enzyme-free hydrogen peroxide (H2O2) detection than those of the bare SiO2 and 3-nm-thick GdOx membranes for the first time. Polycrystalline grain and higher Gd content of the thicker GdOx films are confirmed by transmission electron microscopy (TEM) and X-ray photo-electron spectroscopy (XPS), respectively. In a thicker GdOx membrane, polycrystalline grain has lower energy gap and Gd2+ oxidation states lead to change Gd3+ states in the presence of H2O2, which are confirmed by electron energy loss spectroscopy (EELS). The oxidation/reduction (redox) properties of thicker GdOx membrane with higher Gd content are responsible for detecting H2O2 whereas both bare SiO2 and thinner GdOx membranes do not show sensing. A low detection limit of 1 μM is obtained due to strong catalytic activity of Gd. The reference voltage shift increases with increase of the H2O2 concentration from 1 to 200 μM owing to more generation of Gd3+ ions, and the H2O2 sensing mechanism has been explained as well.
机译:电解质-绝缘体-半导体(EIS)结构中厚度为15 nm的GdOx膜显示的pH灵敏度为54.2 mV / pH,并且无酶的过氧化氢(H2O2)的检测比裸露的SiO2和3-nm-的更高首次使用厚的GdOx膜。分别通过透射电子显微镜(TEM)和X射线光电子能谱(XPS)证实了较厚的GdOx膜的多晶晶粒和较高的Gd含量。在较厚的GdOx膜中,多晶晶粒具有较低的能隙,并且在H2O2存在下,Gd 2 + 的氧化态导致Gd 3 + 态的改变,这被电子证实能量损失谱(EELS)。具有较高Gd含量的较厚GdOx膜的氧化/还原(氧化还原)特性负责检测H2O2,而裸露的SiO2和较薄的GdOx膜均未显示出感测。由于Gd具有强催化活性,因此检出限低至1μM。由于更多的Gd 3 + 离子和H 2 O 2 <的生成,参考电压的变化随着H2O2浓度从1增加到200μM而增加。还已经解释了感应机制。

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