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Possible ferroelectricity in perovskite oxynitride SrTaO2N epitaxial thin films

机译:钙钛矿型氧氮化物SrTaO2N外延薄膜中可能的铁电性

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摘要

Compressively strained SrTaO2N thin films were epitaxially grown on SrTiO3 substrates using nitrogen plasma-assisted pulsed laser deposition. Piezoresponse force microscopy measurements revealed small domains (101–102 nm) that exhibited classical ferroelectricity, a behaviour not previously observed in perovskite oxynitrides. The surrounding matrix region exhibited relaxor ferroelectric-like behaviour, with remanent polarisation invoked by domain poling. First-principles calculations suggested that the small domains and the surrounding matrix had trans-type and a cis-type anion arrangements, respectively. These experiments demonstrate the promise of tailoring the functionality of perovskite oxynitrides by modifying the anion arrangements by using epitaxial strain.
机译:利用氮气等离子体辅助脉冲激光沉积,在SrTiO3衬底上外延生长受压应变SrTaO2N薄膜。压电响应力显微镜测量显示出小区域(10 1 –10 2 nm),表现出经典的铁电性,这种行为以前在钙钛矿型氧氮化物中没有观察到。周围的矩阵区域表现出类似弛豫铁电的行为,并通过磁畴极化激活剩余极化。第一性原理计算表明,小区域和周围基质分别具有反型和顺式阴离子排列。这些实验证明了通过使用外延应变来修饰阴离子排列来调整钙钛矿型氧氮化物功能的希望。

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