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Characterization of Thin Film Materials using SCAN meta-GGA an Accurate Nonempirical Density Functional

机译:使用精确的非经验密度函数SCAN meta-GGA表征薄膜材料

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摘要

We discuss self-consistently obtained ground-state electronic properties of monolayers of graphene and a number of ’beyond graphene’ compounds, including films of transition-metal dichalcogenides (TMDs), using the recently proposed strongly constrained and appropriately normed (SCAN) meta-generalized gradient approximation (meta-GGA) to the density functional theory. The SCAN meta-GGA results are compared with those based on the local density approximation (LDA) as well as the generalized gradient approximation (GGA). As expected, the GGA yields expanded lattices and softened bonds in relation to the LDA, but the SCAN meta-GGA systematically improves the agreement with experiment. Our study suggests the efficacy of the SCAN functional for accurate modeling of electronic structures of layered materials in high-throughput calculations more generally.
机译:我们使用最近提出的强约束和适当规范化(SCAN)的亚原子,讨论了自相一致地获得的石墨烯单层和许多“超越石墨烯”化合物的基态电子性质,包括过渡金属二卤化碳(TMD)的薄膜。密度泛函理论的广义梯度近似(meta-GGA)。将SCAN meta-GGA结果与基于局部密度近似(LDA)和广义梯度近似(GGA)的结果进行比较。正如预期的那样,相对于LDA,GGA产生了扩展的晶格和软化的键,但是SCAN meta-GGA系统地提高了与实验的一致性。我们的研究表明,在更高通量的计算中,SCAN功能可有效地对层状材料的电子结构进行精确建模。

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