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Automatic Release of Silicon Nanowire Arrays with a High Integrity for Flexible Electronic Devices

机译:具有高完整性的硅纳米线阵列自动释放用于柔性电子设备

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摘要

Automatic release and vertical transferring of silicon/silicon oxide nanowire arrays with a high integrity are demonstrated by an Ag-assisted ammonia etching method. By adding a water steaming step between Ag-assisted HF/H2O2 and ammonia etching to form a SiOx protective layer sheathing Si nanowires, we can tune the composition of the nanowires from SiOx (0 ≤ x ≤ 2) to Si nanowires. Ag plays a key role to the neat and uniform release of Si/SiOx nanowire arrays from Si wafer in the ammonia etching process. The vertical Si nanowire array device, with both sides having high-quality Ohmic contact, can be transferred to arbitrary substrates, especially on a flexible substrate. The method developed here offers a facile method to realize flexible Si nanowire array functional devices.
机译:具有银完整性的硅/二氧化硅纳米线阵列的自动释放和垂直转移已通过Ag辅助氨蚀刻法得到了证明。通过在银辅助的HF / H2O2和氨蚀刻之间添加水蒸汽处理步骤,以形成覆盖Si纳米线的SiOx保护层,我们可以将纳米线的组成从SiOx(0≤x≤2)调整为Si纳米线。 Ag对氨蚀刻工艺中Si / SiOx纳米线阵列从硅片中均匀,均匀地释放起着关键作用。可以使两侧都具有高质量欧姆接触的垂直Si纳米线阵列器件可以转移到任意衬底上,尤其是在柔性衬底上。这里开发的方法提供了一种实现柔性Si纳米线阵列功能器件的简便方法。

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