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Dislocation driven nanosample plasticity: new insights from quantitative in-situ TEM tensile testing

机译:位错驱动的纳米样品可塑性:定量原位TEM拉伸测试的新见解

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摘要

Intrinsic dislocation mechanisms in the vicinity of free surfaces of an almost FIB damage-free single crystal Ni sample have been quantitatively investigated owing to a novel sample preparation method combining twin-jet electro-polishing, in-situ TEM heating and FIB. The results reveal that the small-scale plasticity is mainly controlled by the conversion of few tangled dislocations, still present after heating, into stable single arm sources (SASs) as well as by the successive operation of these sources. Strain hardening resulting from the operation of an individual SAS is reported and attributed to the decrease of the length of the source. Moreover, the impact of the shortening of the dislocation source on the intermittent plastic flow, characteristic of SASs, is discussed. These findings provide essential information for the understanding of the regime of ‘dislocation source’ controlled plasticity and the related mechanical size effect.
机译:由于双射流电抛光,原位TEM加热和FIB相结合的新型样品制备方法,已经对FIB几乎无损伤的单晶Ni样品的自由表面附近的固有位错机理进行了定量研究。结果表明,小规模可塑性主要受加热后仍存在的少量纠缠位错转换成稳定的单臂离子源(SAS)以及这些离子源的连续操作的控制。报告了由于单个SAS的运行而导致的应变硬化,这归因于源长度的减少。此外,讨论了位错源缩短对间歇性塑性流动的影响,这是SAS的特征。这些发现为理解“位错源”控制的可塑性和相关的机械尺寸效应提供了重要信息。

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