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Explaining Evaporation-Triggered Wetting Transition Using Local Force Balance Model and Contact Line-Fraction

机译:使用局部力平衡模型和接触线摩擦力解释蒸发触发的润湿转变

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摘要

Understanding wettability and mechanisms of wetting transition are important for design and engineering of superhydrophobic surfaces. There have been numerous studies on the design and fabrication of superhydrophobic and omniphobic surfaces and on the wetting transition mechanisms triggered by liquid evaporation. However, there is a lack of a universal method to examine wetting transition on rough surfaces. Here, we introduce force zones across the droplet base and use a local force balance model to explain wetting transition on engineered nanoporous microstructures, utilizing a critical force per unit length (FPL) value. For the first time, we provide a universal scale using the concept of the critical FPL value which enables comparison of various superhydrophobic surfaces in terms of preventing wetting transition during liquid evaporation. In addition, we establish the concept of contact line-fraction theoretically and experimentally by relating it to area-fraction, which clarifies various arguments about the validity of the Cassie-Baxter equation. We use the contact line-fraction model to explain the droplet contact angles, liquid evaporation modes, and depinning mechanism during liquid evaporation. Finally, we develop a model relating a droplet curvature to conventional beam deflection, providing a framework for engineering pressure stable superhydrophobic surfaces.
机译:了解润湿性和润湿转变的机理对于超疏水表面的设计和工程非常重要。关于超疏水和全疏水表面的设计和制造,以及由液体蒸发引发的润湿转变机理,已有许多研究。但是,缺乏一种检查粗糙表面上润湿转变的通用方法。在这里,我们介绍了横跨液滴基体的力区,并使用局部力平衡模型来解释工程化纳米孔微结构上的润湿转变,并利用每单位长度的临界力(FPL)值。我们首次使用临界FPL值的概念提供了一种通用标度,它可以比较各种超疏水表面,以防止液体蒸发过程中的润湿转变。此外,我们通过将接触线分数与面积分数相关联来建立理论上和实验上的接触线分数概念,从而澄清了有关Cassie-Baxter方程有效性的各种观点。我们使用接触线分数模型来解释液滴在液体蒸发过程中的接触角,液体蒸发模式和脱钉机理。最后,我们开发了一个将液滴曲率与常规光束偏转相关的模型,为工程压力稳定的超疏水表面提供了框架。

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