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Theoretical predictions for hot-carrier generation from surface plasmon decay

机译:表面等离子体激元衰减产生热载流子的理论预测

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摘要

Decay of surface plasmons to hot carriers finds a wide variety of applications in energy conversion, photocatalysis and photodetection. However, a detailed theoretical description of plasmonic hot-carrier generation in real materials has remained incomplete. Here we report predictions for the prompt distributions of excited ‘hot’ electrons and holes generated by plasmon decay, before inelastic relaxation, using a quantized plasmon model with detailed electronic structure. We find that carrier energy distributions are sensitive to the electronic band structure of the metal: gold and copper produce holes hotter than electrons by 1–2 eV, while silver and aluminium distribute energies more equitably between electrons and holes. Momentum-direction distributions for hot carriers are anisotropic, dominated by the plasmon polarization for aluminium and by the crystal orientation for noble metals. We show that in thin metallic films intraband transitions can alter the carrier distributions, producing hotter electrons in gold, but interband transitions remain dominant.
机译:表面等离子体激元向热载流子的衰减在能量转换,光催化和光检测中发现了广泛的应用。但是,在实际材料中产生等离激元热载流子的详细理论描述仍不完整。在这里,我们使用具有详细电子结构的量化等离激元模型,报告了在无弹性弛豫之前由等离激元衰减产生的激发的“热”电子和空穴迅速分布的预测。我们发现载流子能量分布对金属的电子能带结构很敏感:金和铜产生的空穴比电子高1-2eV,而银和铝在电子和空穴之间更均匀地分配能量。热载流子的动量方向分布是各向异性的,主要受铝的等离激元极化和贵金属的晶体取向影响。我们表明,在金属薄膜中,带内跃迁可以改变载流子分布,从而在金中产生较热的电子,但带间跃迁仍然占主导地位。

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