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Neutron reflectometry on highly absorbing films and its application to 10B4C-based neutron detectors

机译:高吸收膜上的中子反射法及其在基于10B4C的中子探测器中的应用

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摘要

Neutron reflectometry is a powerful tool used for studies of surfaces and interfaces. The absorption in the typical studied materials is neglected and this technique is limited only to the reflectivity measurement. For strongly absorbing nuclei, the absorption can be directly measured by using the neutron-induced fluorescence technique which exploits the prompt particle emission of absorbing isotopes. This technique is emerging from soft matter and biology where highly absorbing nuclei, in very small quantities, are used as a label for buried layers. Nowadays, the importance of absorbing layers is rapidly increasing, partially because of their application in neutron detection; a field that has become more active also due to the 3He-shortage. We extend the neutron-induced fluorescence technique to the study of layers of highly absorbing materials, in particular 10B4C. The theory of neutron reflectometry is a commonly studied topic; however, when a strong absorption is present the subtle relationship between the reflection and the absorption of neutrons is not widely known. The theory for a general stack of absorbing layers has been developed and compared to measurements. We also report on the requirements that a 10B4C layer must fulfil in order to be employed as a converter in neutron detection.
机译:中子反射法是用于研究表面和界面的强大工具。忽略了典型研究材料中的吸收,该技术仅限于反射率测量。对于强吸收核,可以使用中子感应荧光技术直接测量吸收,该技术利用吸收同位素的迅速粒子发射。该技术是从软物质和生物学中兴起的,其中极少量的高吸收核被用作埋层的标记。如今,吸收层的重要性正在迅速提高,部分原因是吸收层在中子检测中的应用。由于 3 He短缺,该字段变得更加活跃。我们将中子诱导的荧光技术扩展到高吸收材料层的研究,特别是 10 B4C。中子反射测量理论是一个经常研究的话题。但是,当存在强吸收时,反射与中子吸收之间的微妙关系并不广为人知。已经开发出用于吸收层的一般堆叠的理论,并将其与测量结果进行了比较。我们还报告了 10 B4C层必须满足的要求,以便用作中子检测转换器。

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