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High-rate dead-time corrections in a general purpose digital pulse processing system

机译:通用数字脉冲处理系统中的高空载时间校正

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摘要

Dead-time losses are well recognized and studied drawbacks in counting and spectroscopic systems. In this work the abilities on dead-time correction of a real-time digital pulse processing (DPP) system for high-rate high-resolution radiation measurements are presented. The DPP system, through a fast and slow analysis of the output waveform from radiation detectors, is able to perform multi-parameter analysis (arrival time, pulse width, pulse height, pulse shape, etc.) at high input counting rates (ICRs), allowing accurate counting loss corrections even for variable or transient radiations. The fast analysis is used to obtain both the ICR and energy spectra with high throughput, while the slow analysis is used to obtain high-resolution energy spectra. A complete characterization of the counting capabilities, through both theoretical and experimental approaches, was performed. The dead-time modeling, the throughput curves, the experimental time-interval distributions (TIDs) and the counting uncertainty of the recorded events of both the fast and the slow channels, measured with a planar CdTe (cadmium telluride) detector, will be presented. The throughput formula of a series of two types of dead-times is also derived. The results of dead-time corrections, performed through different methods, will be reported and discussed, pointing out the error on ICR estimation and the simplicity of the procedure. Accurate ICR estimations (nonlinearity < 0.5%) were performed by using the time widths and the TIDs (using 10 ns time bin width) of the detected pulses up to 2.2 Mcps. The digital system allows, after a simple parameter setting, different and sophisticated procedures for dead-time correction, traditionally implemented in complex/dedicated systems and time-consuming set-ups.
机译:死区时间损失已得到公认,并已在计数和光谱系统中研究了其缺点。在这项工作中,提出了用于高速率高分辨率辐射测量的实时数字脉冲处理(DPP)系统的死区校正功能。通过快速和缓慢地分析辐射探测器的输出波形,DPP系统能够以高输入计数率(ICR)执行多参数分析(到达时间,脉冲宽度,脉冲高度,脉冲形状等)。 ,即使对于可变或瞬态辐射,也可以进行精确的计数损耗校正。快速分析用于获得高通量的ICR和能谱,而慢速分析用于获得高分辨率的能谱。通过理论和实验方法对计数能力进行了完整的表征。将介绍使用平面CdTe(碲化镉)检测器测量的空载时间模型,吞吐量曲线,实验时间间隔分布(TID)和快速和慢速通道记录事件的计数不确定性。还推导出一系列两种停滞时间的吞吐量公式。将报告和讨论通过不同方法执行的停滞时间校正的结果,并指出ICR估计的误差和程序的简单性。通过使用检测到的脉冲的时间宽度和TID(使用10µns的时间仓宽度),进行精确的ICR估计(非线性<0.5%),直到2.2µMcps。在简单的参数设置之后,数字系统允许采用不同而复杂的空载时间校正程序,传统上是在复杂/专用系统和耗时的设置中实施的。

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