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Temporal binning of time-correlated single photon counting data improves exponential decay fits and imaging speed

机译:时间相关的单光子计数数据的时间分档可改善指数衰减拟合和成像速度

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摘要

Time-correlated single photon counting (TCSPC) enables acquisition of fluorescence lifetime decays with high temporal resolution within the fluorescence decay. However, many thousands of photons per pixel are required for accurate lifetime decay curve representation, instrument response deconvolution, and lifetime estimation, particularly for two-component lifetimes. TCSPC imaging speed is inherently limited due to the single photon per laser pulse nature and low fluorescence event efficiencies (<10%) required to reduce bias towards short lifetimes. Here, simulated fluorescence lifetime decays are analyzed by SPCImage and SLIM Curve software to determine the limiting lifetime parameters and photon requirements of fluorescence lifetime decays that can be accurately fit. Data analysis techniques to improve fitting accuracy for low photon count data were evaluated. Temporal binning of the decays from 256 time bins to 42 time bins significantly (p<0.0001) improved fit accuracy in SPCImage and enabled accurate fits with low photon counts (as low as 700 photons/decay), a 6-fold reduction in required photons and therefore improvement in imaging speed. Additionally, reducing the number of free parameters in the fitting algorithm by fixing the lifetimes to known values significantly reduced the lifetime component error from 27.3% to 3.2% in SPCImage (p<0.0001) and from 50.6% to 4.2% in SLIM Curve (p<0.0001). Analysis of nicotinamide adenine dinucleotide–lactate dehydrogenase (NADH-LDH) solutions confirmed temporal binning of TCSPC data and a reduced number of free parameters improves exponential decay fit accuracy in SPCImage. Altogether, temporal binning (in SPCImage) and reduced free parameters are data analysis techniques that enable accurate lifetime estimation from low photon count data and enable TCSPC imaging speeds up to 6x and 300x faster, respectively, than traditional TCSPC analysis.
机译:与时间相关的单光子计数(TCSPC)能够在荧光衰减范围内以高时间分辨率获取荧光寿命衰减。但是,精确的寿命衰减曲线表示,仪器响应去卷积和寿命估计(特别是对于两组分寿命)而言,每个像素需要成千上万个光子。 TCSPC成像速度固有地受到限制,这是因为每个激光脉冲具有单个光子的性质以及降低对短寿命的偏见所需的低荧光事件效率(<10%)。在此,通过SPCImage和SLIM Curve软件分析模拟的荧光寿命衰减,以确定可以精确拟合的极限寿命参数和荧光寿命衰减的光子要求。评估了提高低光子计数数据拟合精度的数据分析技术。从256个时间仓到42个时间仓的时间分档显着(p <0.0001)提高了SPCImage的拟合精度,并实现了低光子数(低至700个光子/衰变)的精确拟合,所需光子减少了6倍因此提高了成像速度。此外,通过将寿命固定为已知值来减少拟合算法中的自由参数数量,可将寿命分量误差从SPCImage中的27.3%降至3.2%(p <0.0001),从SLIM曲线中的50.6%降至4.2%(p <0.0001)。对烟酰胺腺嘌呤二核苷酸-乳酸脱氢酶(NADH-LDH)解决方案的分析证实了TCSPC数据的时间分档,减少的自由参数数量提高了SPCImage的指数衰减拟合精度。总而言之,时间装仓(在SPCImage中)和减少的自由参数是数据分析技术,可从低光子数数据中进行准确的寿命估计,并使TCSPC成像速度分别比传统TCSPC分析快6倍和300倍。

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