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Observing single nanoparticle events at the orifice of a nanopipet

机译:观察纳米吸管孔口处的单个纳米粒子事件

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摘要

Single nanoparticle (NP) events are successfully observed at the orifice of a nanopipet by blocking the ionic current with a single NP. In addition to the traditional translocation events, we observe both staircase and blip current transients by controlling the radius ratio of NPs to nanopipet or bias potential. Confocal fluorescence microscopy and finite element simulation are used to simultaneously monitor and quantitatively understand these events, respectively. The frequency of the staircase and blip events is proportional to the NP concentration, and could be used for the quantification of NPs. This study offers a new method for NP determination and single NP behavior study.
机译:通过用单个NP阻断离子电流,可以在纳米吸管的孔口成功观察到单个纳米颗粒(NP)事件。除传统的易位事件外,我们还通过控制NP与纳米移液管或偏置电位的半径比来观察阶梯电流和瞬态电流瞬变。共聚焦荧光显微镜和有限元模拟分别用于同时监视和定量了解这些事件。阶梯和斑点事件的频率与NP浓度成正比,可用于NP的定量。该研究为NP测定和单NP行为研究提供了一种新方法。

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