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High-speed Particle Image Velocimetry Near Surfaces

机译:表面附近的高速粒子图像测速

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摘要

Multi-dimensional and transient flows play a key role in many areas of science, engineering, and health sciences but are often not well understood. The complex nature of these flows may be studied using particle image velocimetry (PIV), a laser-based imaging technique for optically accessible flows. Though many forms of PIV exist that extend the technique beyond the original planar two-component velocity measurement capabilities, the basic PIV system consists of a light source (laser), a camera, tracer particles, and analysis algorithms. The imaging and recording parameters, the light source, and the algorithms are adjusted to optimize the recording for the flow of interest and obtain valid velocity data. Common PIV investigations measure two-component velocities in a plane at a few frames per second. However, recent developments in instrumentation have facilitated high-frame rate (> 1 kHz) measurements capable of resolving transient flows with high temporal resolution. Therefore, high-frame rate measurements have enabled investigations on the evolution of the structure and dynamics of highly transient flows. These investigations play a critical role in understanding the fundamental physics of complex flows.A detailed description for performing high-resolution, high-speed planar PIV to study a transient flow near the surface of a flat plate is presented here. Details for adjusting the parameter constraints such as image and recording properties, the laser sheet properties, and processing algorithms to adapt PIV for any flow of interest are included.
机译:多维流和瞬态流在科学,工程学和健康科学的许多领域中起着关键作用,但通常并没有很好地理解。可以使用粒子图像测速技术(PIV)研究这些流的复杂性质,PIV是一种基于激光的光学技术,可用于光学访问流。尽管存在许多形式的PIV,但其技术已超出了最初的平面两分量速度测量功能,但基本的PIV系统由光源(激光),照相机,示踪剂粒子和分析算法组成。调整成像和记录参数,光源和算法,以优化所关注流的记录并获得有效的速度数据。常见的PIV研究以每秒几帧的速度测量飞机中的两分量速度。然而,仪器仪表的最新发展促进了高帧频(> 1 kHz)测量,能够以高时间分辨率解决瞬态流。因此,高帧速率测量使得能够研究高瞬态流的结构演变和动力学。这些研究在理解复杂流的基本物理过程中起着至关重要的作用。这里提供了执行高分辨率,高速平面PIV以研究平板表面附近的瞬态流的详细描述。包括用于调整参数约束的详细信息,例如图像和记录属性,激光薄片属性以及使PIV适应任何感兴趣的流程的处理算法。

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