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Static Hyperspectral Fluorescence Imaging of Viscous Materials Based on a Linear Variable Filter Spectrometer

机译:基于线性可变滤光片光谱仪的粘性材料静态高光谱荧光成像

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摘要

This paper presents a low-cost hyperspectral measurement setup in a new application based on fluorescence detection in the visible (Vis) wavelength range. The aim of the setup is to take hyperspectral fluorescence images of viscous materials. Based on these images, fluorescent and non-fluorescent impurities in the viscous materials can be detected. For the illumination of the measurement object, a narrow-band high-power light-emitting diode (LED) with a center wavelength of 370 nm was used. The low-cost acquisition unit for the imaging consists of a linear variable filter (LVF) and a complementary metal oxide semiconductor (CMOS) 2D sensor array. The translucent wavelength range of the LVF is from 400 nm to 700 nm. For the confirmation of the concept, static measurements of fluorescent viscous materials with a non-fluorescent impurity have been performed and analyzed. With the presented setup, measurement surfaces in the micrometer range can be provided. The measureable minimum particle size of the impurities is in the nanometer range. The recording rate for the measurements depends on the exposure time of the used CMOS 2D sensor array and has been found to be in the microsecond range.
机译:本文介绍了一种基于可见光(Vis)波长范围内荧光检测的新应用中的低成本高光谱测量设置。该装置的目的是拍摄粘性材料的高光谱荧光图像。基于这些图像,可以检测出粘性材料中的荧光和非荧光杂质。为了照明测量对象,使用了中心波长为370 nm的窄带高功率发光二极管(LED)。用于成像的低成本采集单元由线性可变滤波器(LVF)和互补金属氧化物半导体(CMOS)2D传感器阵列组成。 LVF的半透明波长范围是400 nm至700 nm。为了证实这一概念,已经对具有非荧光杂质的荧光粘性材料进行了静态测量并进行了分析。通过提出的设置,可以提供微米范围内的测量表面。杂质的可测量的最小粒度在纳米范围内。测量的记录速率取决于所用的CMOS 2D传感器阵列的曝光时间,并且发现其处于微秒范围内。

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