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X-ray laser–induced electron dynamics observed by femtosecond diffraction from nanocrystals of Buckminsterfullerene

机译:飞秒衍射从Buckminsterfullerene纳米晶体观察到X射线激光诱导的电子动力学

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摘要

X-ray free-electron lasers (XFELs) deliver x-ray pulses with a coherent flux that is approximately eight orders of magnitude greater than that available from a modern third-generation synchrotron source. The power density of an XFEL pulse may be so high that it can modify the electronic properties of a sample on a femtosecond time scale. Exploration of the interaction of intense coherent x-ray pulses and matter is both of intrinsic scientific interest and of critical importance to the interpretation of experiments that probe the structures of materials using high-brightness femtosecond XFEL pulses. We report observations of the diffraction of extremely intense 32-fs nanofocused x-ray pulses by a powder sample of crystalline C60. We find that the diffraction pattern at the highest available incident power significantly differs from the one obtained using either third-generation synchrotron sources or XFEL sources operating at low output power and does not correspond to the diffraction pattern expected from any known phase of crystalline C60. We interpret these data as evidence of a long-range, coherent dynamic electronic distortion that is driven by the interaction of the periodic array of C60 molecular targets with intense x-ray pulses of femtosecond duration.
机译:X射线自由电子激光器(XFEL)发射的X射线脉冲的相干通量比现代第三代同步加速器源的相干通量大大约8个数量级。 XFEL脉冲的功率密度可能很高,以至于它可以在飞秒的时间尺度上改变样品的电子特性。探索强相干x射线脉冲与物质的相互作用既具有内在的科学兴趣,又对于解释使用高亮度飞秒XFEL脉冲探测材料结构的实验的解释至关重要。我们报告了晶体C60粉末样品对极强的32-fs纳米聚焦x射线脉冲的衍射观察结果。我们发现,在最高可用入射功率下的衍射图谱与使用第三代同步加速器源或在低输出功率下工作的XFEL源获得的衍射图谱显着不同,并且与晶体C60的任何已知相所预期的衍射图谱都不对应。我们将这些数据解释为远距离,相干动态电子畸变的证据,该畸变是由C60分子靶分子的周期性阵列与飞秒持续时间的强X射线脉冲相互作用而驱动的。

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