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X-ray microtomography using correlation of near-field speckles for material characterization

机译:X射线显微断层摄影术利用近场散斑相关性进行材料表征

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摘要

Nondestructive microscale investigation of objects is an invaluable tool in life and materials sciences. Currently, such investigation is mainly performed with X-ray laboratory systems, which are based on absorption-contrast imaging and cannot access the information carried by the phase of the X-ray waves. The phase signal is, nevertheless, of great value in X-ray imaging as it is complementary to the absorption information and in general more sensitive to visualize features with small density differences. Synchrotron facilities, which deliver a beam of high brilliance and high coherence, provide the ideal condition to develop such advanced phase-sensitive methods, but their access is limited. Here we show how a small modification of a laboratory setup yields simultaneously quantitative and 3D absorption and phase images of the object. This single-shot method is based on correlation of X-ray near-field speckles and represents a significant broadening of the capabilities of laboratory-based X-ray tomography.
机译:物体的无损微观研究是生命科学和材料科学中的宝贵工具。当前,这种研究主要是用基于吸收对比成像的X射线实验室系统来进行的,并且不能访问X射线波相位所携带的信息。但是,相位信号在X射线成像中具有很大的价值,因为它是吸收信息的补充,并且通常对以较小的密度差可视化的特征更为敏感。同步加速器设备可发出高亮度和高相干光束,为开发此类先进的相敏方法提供了理想条件,但其访问受到限制。在这里,我们显示了对实验室设置的少量修改如何同时产生对象的定量和3D吸收和相位图像。这种单发方法基于X射线近场散斑的相关性,并且代表了基于实验室的X射线断层摄影技术的显着扩展。

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