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Impedance Spectroscopic Investigation of Proton Conductivity in Nafion Using Transient Electrochemical Atomic Force Microscopy (AFM)

机译:瞬态电化学原子力显微镜(AFM)用于Nafion质子电导率的阻抗谱研究

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摘要

Spatially resolved impedance spectroscopy of a Nafion polyelectrolyte membrane is performed employing a conductive and Pt-coated tip of an atomic force microscope as a point-like contact and electrode. The experiment is conducted by perturbing the system by a rectangular voltage step and measuring the incurred current, followed by Fourier transformation and plotting the impedance against the frequency in a conventional Bode diagram. To test the potential and limitations of this novel method, we present a feasibility study using an identical hydrogen atmosphere at a well-defined relative humidity on both sides of the membrane. It is demonstrated that good quality impedance spectra are obtained in a frequency range of 0.2–1000 Hz. The extracted polarization curves exhibit a maximum current which cannot be explained by typical diffusion effects. Simulation based on equivalent circuits requires a Nernst element for restricted diffusion in the membrane which suggests that this effect is based on the potential dependence of the electrolyte resistance in the high overpotential region.
机译:Nafion聚电解质膜的空间分辨阻抗光谱学是通过使用原子力显微镜的导电且涂有Pt的尖端作为点状触点和电极来进行的。通过以矩形电压步长扰动系统并测量产生的电流,然后进行傅立叶变换并在常规的Bode图中绘制阻抗相对于频率的曲线来进行实验。为了测试这种新方法的潜力和局限性,我们提出了使用可行性的研究,即在膜的两侧均以明确定义的相对湿度使用相同的氢气气氛。结果表明,在0.2–1000 Hz的频率范围内可获得高质量的阻抗谱。提取的极化曲线显示出最大电流,无法用典型的扩散效应来解释。基于等效电路的仿真需要Nernst元素来限制膜中的扩散,这表明该效应是基于高超电势区域中电解质电阻的电势依赖性。

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