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Challenges and solutions for the analysis of in situ in crystallo micro-spectrophotometric data

机译:晶体显微分光光度数据中原位分析的挑战和解决方案

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摘要

Combining macromolecular crystallography with in crystallo micro-spectrophotometry yields valuable complementary information on the sample, including the redox states of metal cofactors, the identification of bound ligands and the onset and strength of undesired photochemistry, also known as radiation damage. However, the analysis and processing of the resulting data differs significantly from the approaches used for solution spectrophotometric data. The varying size and shape of the sample, together with the suboptimal sample environment, the lack of proper reference signals and the general influence of the X-ray beam on the sample have to be considered and carefully corrected for. In the present article, how to characterize and treat these sample-dependent artefacts in a reproducible manner is discussed and the SLS-APE in situ, in crystallo optical spectroscopy data-analysis toolbox is demonstrated.
机译:将大分子晶体学与晶体显微分光光度法结合使用,可在样品上产生有价值的补充信息,包括金属辅因子的氧化还原状态,结合配体的鉴定以及不良光化学的发生和强度,也称为辐射损伤。但是,对所得数据的分析和处理与用于溶液分光光度数据的方法明显不同。样品的大小和形状的变化,以及次优的样品环境,缺乏适当的参考信号,以及X射线束对样品的一般影响,都必须加以考虑并加以纠正。在本文中,讨论了如何以可再现的方式表征和处理这些依赖样品的伪像,并在晶体光谱数据分析工具箱中演示了SLS-APE原位。

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