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Analysis of the Voltage Losses in CZTSSe Solar Cellsof Varying Sn Content

机译:CZTSSe太阳能电池的电压损耗分析锡含量变化

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摘要

The performance of kesterite (Cu2ZnSn(S,Se)4, CZTSSe) solar cells is hindered by low open circuit voltage (Voc). The commonly used metric for Voc-deficit, namely, the difference between the absorber band gap and qVoc, is not well-defined for compositionally complex absorbers like kesterite where the bandgap is hard to determine. Here, nonradiative voltage losses are analyzed by measuring the radiative limit of Voc, using external quantum efficiency (EQE) and electroluminescence (EL) spectra, without relying on precise knowledge of the bandgap. The method is applied to a series of Cu2ZnSn(S,Se)4 devices with Sn content variation from 27.6 to 32.9 at. % and a corresponding Voc range from 423 to 465 mV. Surprisingly, the lowest nonradiative loss, and hence the highest external luminescence efficiency (QELED), were obtained for the device with the lowest Voc. The trend is assigned to better interface quality between absorber and CdS buffer layer at lower Sn content.
机译:低开路电压(Voc)阻碍了钾钛矿(Cu2ZnSn(S,Se)4,CZTSSe)太阳能电池的性能。对于难以确定带隙的成分复杂的吸收体(如钾钛矿),通常无法确定Voc缺陷的常用量度,即吸收带隙与qVoc之差。在这里,不依赖带隙的精确知识,通过使用外部量子效率(EQE)和电致发光(EL)光谱测量Voc的辐射极限来分析非辐射电压损失。该方法适用于一系列的Sn含量在27.6至32.9 at之间变化的Cu2ZnSn(S,Se)4器件。 %,相应的Voc范围为423至465 mV。令人惊讶的是,对于具有最低Voc的器件,获得了最低的非辐射损耗,从而获得了最高的外部发光效率(QELED)。趋势是在较低Sn含量下吸收体和CdS缓冲层之间的界面质量更好。

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