首页> 中文期刊> 《半导体光子学与技术:英文版》 >Novel IGBT SPICE Model with Non-destructive Parameter Extraction and Comparison with Measurements

Novel IGBT SPICE Model with Non-destructive Parameter Extraction and Comparison with Measurements

         

摘要

A subcircuit based model for the insulated gate bipolar transistor(IGBT) is proposed and optimized. The IGBT wide base conductivity modulated resistor is effectively equivalent by using a voltage controlled resistor. Based on analytical equation describing the semiconductor physics, the model parameters are extracted accurately via measured data without device destruction. Employing the MOS level 8 SPICE model, the proposed IGBT subcircuit model gives more simulation accuracy and easy convergence, the simulation results are verified by comparison with measured results.

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