A high resolution (203 eV/Mn Kα) portable X-ray fluorescence spectrometer with 241Am as X-ray excitation source and Si-PIN as detector has been developed. A high performance application software with functions of automatic data acquisition, qualitative and quantitative analysis has been incorporated into the system. The instrument is small in size, light in weight, and portable. The long term stability of the system is satisfactory with a variation of 5% in 8 h. The detection limits of this system for most elements are one order of magnitude lower than the system with sealed proportional counter. Analytical applications of this system in rock and mineral analysis are also given.%采用Si-PIN高分辨率探测器,研制了2408道X射线荧光分析仪,其体积小、重量轻、携带方便。能量分辨率为203 eV/Mn Kα;稳定性为5%(8 h);配备了专门的、操作简便的软件系统。在地质和矿物样品分析中进行了应用,与封闭正比计数器X射线荧光分析仪相比,检出限降低了一个数量级。
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