In-situ synchrotron high energy X-ray diffraction study of spontaneous reorientation of R phase upon cooling in nanocrystalline Ti_(50)Ni_(45.5)Fe_(4.5)alloy

摘要

This study investigated a peculiar phenomenon of self-reorientation of thermally formed R phase in nanocrystalline Ti_(50)Ni_(45.5)Fe_(4.5)by means of in-situ syn-chrotron high energy X-ray diffraction(HE-XRD).Two samples with different average grain sizes of 40 and 90 nm were investigated.R phase in the 40-nm grain size sample was found to self-reorient gradually upon cooling,whereas the same phenomenon did not occur in the 90-nm grain size sample.This self-reorientation process is attributed to the development and evolution of an internal stress anisotropy caused by the second order continuous lattice distortion of R phase upon further cooling in the small nanograined matrix,which lacks the self-accommodation mechanism for internal stress cancellation.