叶枯病是小麦常见病害,由多种病菌引起.本文通过野生二粒小麦叶片的叶枯病病斑表型,菌落和孢子形态,真菌ITS1、5.8S rDNA和ITS2区域序列的进化分析以及科赫氏法则等试验表明,链格孢真菌Alternaria alternata是本研究供试野生二粒小麦叶枯病的致病菌.为进一步研究野生二粒小麦中抗病基因的遗传特性,配置了抗感杂交并获得了遗传群体.对F1、F2以及F3株系病情的遗传分析表明,在抗病亲本‘JIC1060003'中存在一对显性抗病基因,同时双亲中可能还存在微效的数量性状抗病位点.本研究为进一步通过遗传作图获得与抗病基因连锁的分子标记和抗病基因的进一步利用奠定了基础.%Wheat leaf blotch caused by different kinds of pathogens is one of the major diseases in wheat. In this study, We showed that Alternaria alternata is the pathogen of leaf blotch according to the phenotypes of the leaf blotch, morphology of the conidiophore, Koch's Rule experiments, molecular phylogeny analysis based on DNA sequence from the internal transcribed spacer (ITS) region (ITS1, 5. 8S rRNA gene, ITS2). In order to know the inheritance of the resistance gene in wheat, F2:3 family lines produced by the resistant ('JIC106003') and susceptible ('JIC106007') wild emmer were evaluated in the field and under controlled conditions, and the resistance to A. Alternata was found to be controlled by one major dominant gene and several minor effect quantitative genes. The results and resources obtained in this study may be useful for further mining molecular markers linked to resistant gene and utilizing the resistant gene in wheat breeding.
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