Effects　of　radiation－induced　oxide　and　interface　charges　on　mobility　degradation　in　MOSFETs

摘要

Ｅｆｆｅｃｔｓｏｆｒａｄｉａｔｉｏｎ－ｉｎｄｕｃｅｄｏｘｉｄｅａｎｄｉｎｔｅｒｆａｃｅｃｈａｒｇｅｓｏｎｍｏｂｉｌｉｔｙｄｅｇｒａｄａｔｉｏｎｉｎ　ＭＯＳＦＥＴｓＲｅｎＤｉ－Ｙｕａｎ（任迪远）；ＹｕＸｕｅ－Ｆｅｎｇ（余学锋）；ＬｕＷｕ（陆妩）；Ｇａｏ...