This article introduces possibility for measuring the paper basisweight (mass thickness per unit area)by low energy γ-ray backscattering techniques.The relation between the paper basis weight and the intensity of low energy γ-ray backscattering has been established.A measuring device has been complected and its measuring results are analysed.%叙述了低能γ射线反散射法测量纸张定量的可能性,建立了纸张定量与反散射γ射线强度的关系式。研制了一套测量装置,并对测量误差进行了分析。
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