首页> 中文期刊>核电子学与探测技术 >用于中子单色器镶嵌分布测量的γ衍射装置的调试方法

用于中子单色器镶嵌分布测量的γ衍射装置的调试方法

     

摘要

用γ衍射方法可以分析中子单色器晶体的镶嵌分布.由于γ射线的波长短,满足布拉格衍射条件的入射角比通常X衍射的要小两个量级,加上晶体镶嵌分布需要较高的分辨率,因此要成功进行γ衍射实验,必须要求γ衍射装置各部分之间满足精细的几何布局,这只有通过正确的调试才能实现.在建立正确调试方法的基础上,通过仔细调试,用2 Ci的198Au的较低活度γ源,实现了用γ衍射方法对Ce单晶单色器镶嵌分布的测量,得到镶嵌分布的半宽度约为12′,这一结果与期望值吻合.%Gamma diffraction can be used for analyzing the crystal mosaic of neutron monochromator. As γray wavelength is short and high resolution is required for the analysis of crystal mosaic distribution , a elaborate geometric composition of γ - ray diffraction equipment is essential, and such a equipment can be achieved only through adjusting precisely the placement and orientation of all parts of the experiment. The adjusting methods are proposed. Through adjusting experiment according to the methods, the mosaic distribution of Ge single crystal monochromator was measured by γ - ray diffraction successfully with using a radioactive 198 Au source of 2 curies.

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