首页> 中文期刊> 《无损检测》 >基于 SAFT 提高 TOFD 检测缺陷长度定量精度的探讨

基于 SAFT 提高 TOFD 检测缺陷长度定量精度的探讨

         

摘要

针对超声衍射时差(TOFD)方法中由于存在甩弧现象导致缺陷长度测量误差大的问题,借助 CIVA 仿真软件及合成孔径聚焦技术(SAFT),对长度范围5.0~45.0 mm 的9个矩形槽的 D 扫图像进行处理与重建。结果表明,D-SAFT 处理技术能够有效降低干扰衍射信号的影响,使缺陷甩弧现象减弱甚至消失,缺陷最大测量误差由处理前的最大5.0 mm 降低至0.6 mm。此外,对 Farhang 等人提出的变角度解卷积(ADD)结合 SAFT 方法(SAFTADD)在提高 TOFD 缺陷定量精度上的应用前景进行了展望。%In ultrasonic time of fight diffraction (TOFD)inspection,the arcs at the ends of flaws will reduce the quantitative accuracy of flaw length.To solve this problem,numerical simulation with CIVA software was performed,and the synthetic aperture focusing technology (SAFT)was developed to process and reconstruct the D-scan image.Nine rectangular defects with the lengths ranged from 5.0 to 45.0mm were investigated.The results showed that D-SAFT processing technique was effective to weaken the arcs of flaw,and the maximum defect quantitative error was reduced from 5.0mm to 0.6mm.In addition,based on the angle dependent deconvolution (ADD)method combined with SAFT,the improving method of flaw quantitative accuracy in TOFD technique was prospected.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号