基于 ADuC842的中红外激光光斑测量系统设计

摘要

为了测量中红外激光远场光斑，采用光电探测器阵列法研制了一套探测系统。主要包括激光功率衰减装置、中红外光导型 HgCdTe探测器阵列、信号调理电路、模数转换单元、ADuC842微控制器和RS-232接口。设计了中红外光电探测器阵列和相应的信号放大电路，设计了ADuC842的外设接口和数据采集程序。测量系统在实验中得到了应用，给出了实验中典型的波形和单帧光斑。光斑测量系统的空间分辨力为1 cm ，光斑数据刷新频率为8 Hz。%In order to measure the far-field power density distribution of mid-infrared laser , a laser beam profiler based on a photoelectric detector array is designed .The laser beam profi-ler consists of optical attenuators , mid-infrared photoconductive HgCdTe detectors , signal conditioning circuits , an analog-to-digital unit , microcontroller ADuC842 , and a interface RS-232 . The peripheral device interfaces are described . A typical waveform and an image of the mid-infrard laser beam profile obtained by the laser beam profiler in experiment are pres-ented .The spatial resolution of the laser beam profiler is 1 cm , and the data refresh rate is 8 Hz .