首页> 中文期刊> 《西安医科大学学报(英文版)》 >Subthreshold current model of fully depleted dual material gate SOI MOSFET

Subthreshold current model of fully depleted dual material gate SOI MOSFET

         

摘要

Dual material gate SOI MOSFET with asymmetrical halo can suppress short channel effect and increase carriers transport efficiency. The analytical model of its subthreshold drain current is derived based on the explicit solution of two-dimensional Poisson's equation in the depletion region. The model takes into consideration the channel length modulation effect and the contribution of the back channel current component. Its validation is verified by comparision with two dimensional device simulator MEDICI.

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