介绍了一种测试高温超导薄膜微波表面电阻分布的新方法。该方法利用镜像法相关原理，通过引入金属环实现介质谐振器和腔体的能量汇聚，解决了高温超导薄膜微波表面电阻的分布测试通用性与高分辨率不兼容的问题。根据该方法研制了工作在32 GHz的频率下，工作模式为TE012+δ的测试装置，其分辨率为直径5 mm，面积19.6 mm2的圆面。测试装置对一片两英寸YBCO/LAO/YBCO超导薄膜样品进行了13个点的表面电阻分布测试。%A new method for testing the distribution of the microwave surface resistance (Rs) of high temperature superconductor (HTS) is introduced in this paper. By using the mirror method and its relevant principles, the energy convergence of dielectric resonator and cavity is achieved and the incompatible problem between the versatility and high resolution of Rs of HTS thin film is solved through a metal ring. A testing device working at 32 GHz with TE012+δ mode is developed according to this method. The resolution of the device can reach a circle with 5 mm in diameter and 19.6 mm2 in area. In this paper, the distribution test of Rs with thirteen points is conducted on a piece of two inch YBCO/LAO/YBCO superconductor thin film sample by this new testing device.
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