首页> 中文期刊> 《红外与毫米波学报》 >透射式GaAs(Cs,O)光电阴极稳定性的研究

透射式GaAs(Cs,O)光电阴极稳定性的研究

         

摘要

The influence of illumination intensity and residual gases on the stability of negative electron affinity GaAs(Cs,O) photocathodes during operation was investigated in the present work. A comparison was made between the stability of photocathodes installed in activation chamber and tube body. Studies of the activated GaAs photocathode surface and the surface of GaAs photocathode with sensitivity decaying to zero were made using Auger electron spectroscopy. It was found that the degradation of GaAs photocathodes stems maingly from the interaction of harmful residual gases and photocathode surface.%研究了光照强度和残余气体对阴极稳定性的影响,比较阴极在管壳内和激活室内的阴极稳定性,用俄歇谱仪分析激活的GaAs光电阴极表面和灵敏度衰减到0时的GaAs光电阴极表面.结果表明,真空中有害残余气体与阴极表面的相互作用是引起阴极衰减的主要原因.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号