基于多态系统的总线胚胎电子阵列可靠性分析

摘要

通过分析总线胚胎电子阵列(BBEEA)的结构特点和工作原理,将多态系统理论引入到阵列的可靠性分析中,采用通用生成函数(UGF)方法建立了阵列的可靠性分析模型.与基于n/k系统的阵列可靠性分析模型进行对比,验证了基于多态系统阵列可靠性分析模型的正确性和有效性.利用建立的阵列可靠性分析模型对总线胚胎电子阵列的可靠性进行分析,根据阵列的可靠性要求指导阵列的结构设计.同时,对比不同规模总线胚胎电子阵列与典型胚胎电子阵列(EEA)的可靠性,分析总线胚胎电子阵列的性能.分析结果表明:建立的阵列可靠性分析模型能够准确有效地分析阵列的可靠性,将阵列的可靠性分析与工作状态相结合,对阵列的结构设计和预防性维修决策具有重要的指导意义.%Through the analysis on structure characteristics and work principle of bus-based embryonic electronic array (BBEEA),the multi-state system theory is introduced to the reliability analysis of BBEEA,and the universal generating function (UGF) was used to model and analyze BBEEA reliability.Compared with BBEEA reliability model based on n/k system,correctness and validity of BBEEA reliability model based on multi-state system are verified.BBEEA reliability is analyzed based on the proposed multi-state system reliability model so as to guide the structure design of BBEEA according to reliability requirement.At the same time,in order to analyze the performance of BBEEA,comparative analysis of reliability between typical embryonic electronic array (EEA) and BBEEA is completed.The results of analysis show that reliability model based on multi-state system can analyze BBEEA reliability in nature,and it can associate working states and reliability of BBEEA,which has great guiding significance on structure design and preventive maintenance decision of BBEEA.