By analyzing the test data, the relation between the flat-bottomed hole equivalent size of defect and the probe frequency has been obtained.The flat-bottomed hole equivalent size of defect shall be decreased along with the rising of probe frequency, and shall be increased along with the reducing of probe frequency.%通过试验数据分析得出了缺陷平底孔当量尺寸与探头频率的关系,缺陷平底孔当量尺寸随探头频率升高而减小,随探头频率降低而增大。
展开▼