基于1553B总线的BU-61580芯片测试系统的设计与实现

摘要

BU-61580芯片测试系统用于检测DDC公司的BU-61580系列芯片的总线协议功能和电气特性,筛选失效芯片,并具备芯片接口时序调整功能,可检验芯片在不同的接口环境和工作方式下的特殊表现.以Windows XP为开发平台,标准VC++为开发工具,针对该芯片设计一套测试系统.PCI总线接口的专用芯片测试卡能够方便的插入待测试的芯片,与之相应的测试系统能够设置芯片的访问时序,测试芯片工作于不同模式下的状态.实际应用表明,该测试系统具有测试界面灵活、简单、准确的特点,满足了用户的要求.%The aim of test system for the chip BU-61580 is to test the chips' protocol function and electrical specification, to select failed chips, to adjustment the chips' time sequence, to test the performance of chip on different interface element and work mode. In aid of Windows XP system and standard C++ language, a test system is designed and implement. The especial testing card, based on the interface of PCI, is convenient to put a chip on it And the test system can set time sequence of the chip, and test the status of chip on different working mode. The practice application shows that the test system has the features of flexible testing interfaces, simple, accurate to meet requires of users.