射频开关在高低温电测试试验中的失效分析及改进

摘要

This paper, based on all kinds of poor contact phenomenon of the high and low temperature electric test experiment of RF switch, conduct the failure analysis, find out the failure reason, put forward the improvement measures, the main improvement measure is to change the location of the push rod force on the RF switch auxiliary reed. This measure the stress simulation analysis is carried out on the leaf spring by ANSYS software, and combines with high and low temperature electric test experiment of before and after the improvement, obtain the improved RF switch auxiliary reed on the static contact force increases, and solve the auxiliary reed poor contact phenomenon. Therefore, the improved RF switch has better reliability.%本文针对射频开关在高低温电测试试验中，出现的各种接触不良现象，进行了失效分析，找出了失效原因，提出了改进措施，其中最主要的改进措施是更改射频开关辅助簧片上推杆作用力的位置。该措施采用ANSYS软件对辅助簧片进行了应力仿真分析，并结合改进前后的高低温电测试试验，得出了改进后射频开关辅助簧片对静触点的作用力增大，解决了辅助簧片接触不良的现象。因此，改进后的射频开关具有更好的可靠性。