电子设备自动测试系统的通用性设计

摘要

为满足武器电子设备测试通用化的需求,构建了基于VXI总线的通用自动测试系统,在系统架构、测试接口及软件开发等各个方面进行了通用性设计；对信号转接箱的信号总线分类及复用设计、调理模块的通用电路设计等实现测试系统通用化的关键技术进行了重点阐述;该系统已在某型武器电子设备的通用测试中得到应用,实际工程应用表明,该系统性能稳定,测试数据准确可靠,实现了电子设备的通用测试,对其他通用测试系统的组建具有很好的借鉴作用.%In order to satisfy the general test requirement for weapon electronic device, the general ATS based on VXI bus is assembled. The versatilities of system structure, testing interface and software development are designed. The key technology involved in implementing the general test is elaborated, such as the design of the signal bus in signal adaptor and common circuit in switch modules. The system has been successfully used in testing of some electronic devices. After engineering application, it can be proved to be good result for performance and measurement of parameters test, implementing the general test of electronic device, and be a reference for the design of other general test systems.