存储器模块测试系统的设计

摘要

Bus-structured memory modules integrate many kinds of memories, the entire model provide a bus interface. Testing memory modules for all possible failure is essential to a computer system, This paper analyzed the structure of the memory modules carefully, provided a test device for memory modules based on digital waveform generator. Furthermore, this paper extended the March algorithm and proposed a suitable algorithm for testing the memory modules. The system enhanced the fault coverage and the test efficiency, it did well in practical application.%存储器模块上集成有多种类型的存储器,整个模块提供一致的总线访问接口;对存储器模块进行完整的测试是很有必要的,在分析存储器模块的故障模型和测试原理的基础上,给出了一种基于数字波形发生器的存储器模块测试设备结构,通过对March算法进行扩展,设计了一种适合对存储器模块进行测试的算法结构；系统提高了测试的故障覆盖率和效率,在应用中取得了较好的效果.