Flash型FPGA的单粒子效应测试系统研制

摘要

A single-event effect test system for Flash-based FPGA was developed .The system can be used for SRAM/Flash ROM single-event upset effect test ,D-flip flop single-event effect test ,PLL and clock network single-event transient effect test ,and single-event transient pulse width test .The test methods and hardware/software solu-tions were described in this paper .%研制了一套Flash型FPGA的单粒子效应测试系统 ,其具有片上SRAM/Flash ROM 单粒子翻转效应测试、D触发器单粒子效应测试、锁相环与时钟网络单粒子瞬态效应测试、单粒子瞬态脉冲宽度测试等功能.本文介绍了该系统的测试原理和软硬件实现方法.