Accumulator based test set embedding.

摘要

In this paper a test set embedding based on accumulator driven by an odd additive constant is presented. The problem is formulated around finding the location of the test pattern in the sequence generated by the accumulator, given a odd constant C and test set T, in terms of linear Diophantine equation of two variables. We show that the search space for finding the best constant Copt, corresponding to the shortest length, is greatly reduced from the previous approaches presented in [4]. Experimental results show a significant improvement in run time with practically acceptable test length.