首页> 外文学位 >Growth and Characterization of alpha-PbO for Room Temperature Radiation Detection.
【24h】

Growth and Characterization of alpha-PbO for Room Temperature Radiation Detection.

机译:用于室温辐射检测的α-PbO的生长和表征。

获取原文
获取原文并翻译 | 示例

摘要

A global trading structure and high throughput of shipping containers into ports around the world increases the chance of nuclear terrorism via cargo containers. Harmless radioactive sources confuse and impede detection of the materials that pose a real threat, making spectroscopy difficult and requiring detectors with high resolution. The current methods that are used to check containers in ports have security flaws, and only 5% of all shipping containers are checked. The development of semiconductor gamma-ray detectors is one of the protocols being advanced to alleviate this risk because they can function at room temperature and they are cost effective, easily produced, and have high resolution. This dissertation has addressed the current lack of "perfect" room temperature detector materials by investigating alpha-PbO, a novel material in this field. This includes the development of a growth process for alpha-PbO thin films, as well as its structural and performance characterization as a detector material.;Because we intend alpha-PbO to be a photoconductive detector, it should have certain properties. A photoconductive detector consists of a highly resistive material with a voltage bias across it. It absorbs incident gamma-rays, creating electron-hole pairs that provide a signal. To function well, it must have a high atomic number and a high density in order to absorb high-energy photons via the photoelectric effect. It should also have a large resistivity and a wide band gap to avoid large leakage currents at room temperature. Finally, it must have good charge carrier transport properties and detector resolution in order to be able to determine the characteristic energy peaks of the radiation-emitting source. We chose alpha-PbO because it has a very high Z and a very high density and a band gap in the correct range. It also has a rich history of use as a photoconductor that reaches back to the 1950s.;Numerous methods have been used to grow thin films of alpha-PbO. However, rarely are those films single phase or highly oriented. Pulsed laser deposition provides a method to grow epitaxial thin films of alpha-PbO. The structure of the grown films was characterized using X-ray diffraction 2θ-o scans, rocking curves, and reciprocal space mapping. Feedback from a parameterized study of the structural characterization enabled optimization of the growth process to improve the quality of the thin films.;The methods used for the optical measurement of alpha-PbO films included absorption spectroscopy and ellipsometry. Determination of the spectral absorption coefficient was achieved by transmission spectroscopy and reflection spectroscopy via a PerkinElmer Lambda 950 UV-Vis spectrophotometer.;Study of the electronic and transport properties of alpha-PbO is important in order to understand how the material will behave as a radiation detector.;Spectral photoconductivity was measured to ensure that alpha-PbO's response to light was large enough for it to be a useful detector material and to confirm the band gap measurements.;In the field of detector materials, the mutau-product is commonly used as a figure of merit because it enables a measurement of the trapping length of the charge carriers within the detector. Many's equation, which is a derivation of the photocurrent with respect to the applied voltage across a wide band gap semiconductor, is one of the methods used to determine the mutau-product. The photocurrent voltage measurements were obtained from the 0.5 V to 80 V range. This data was difficult to fit with Many's equation over that whole range. Higher voltages displayed deviation from ideal behavior due to the contact effects, but at the lower voltages the data were unaffected. Fits to the lower voltage range, from 0.5 V to 10 V, yielded mutau = 6.8 x 10-4 cm2/V.;Room temperature photoconductors will ultimately be used to detect gamma-rays; however, thin films do not have enough stopping power to absorb the total energy of a gamma-ray. Therefore, we study the alpha-PbO detector response to radiation in the form of alpha particles because they are large, charged, and relatively easy to stop. SRIM calculation estimated that alpha particles have a range of up to 16 mum in alpha-PbO. The initial long-duration film growth yielded films that were ∼ 8 mum thick. Therefore, a full energy peak from alpha particles was not seen in alpha-PbO. We did see a shoulder protruding out of the noise peak due to the charge carriers that were created before the alpha particles escaped the detector volume. (Abstract shortened by UMI.).
机译:全球贸易结构和将集装箱运输到世界各地港口的高吞吐量增加了通过集装​​箱进行核恐怖主义的机会。无害的放射源会混淆并阻碍对构成真正威胁的材料的检测,从而使光谱分析变得困难,并且需要具有高分辨率的检测器。当前用于检查港口集装箱的方法存在安全漏洞,仅检查了所有运输集装箱的5%。半导体伽马射线探测器的开发是缓解这种风险的先进协议之一,因为它们可以在室温下工作,并且具有成本效益,易于生产且具有高分辨率。本论文通过研究α-PbO(该领域的新型材料)解决了目前缺少“完美”的室温检测器材料的问题。这包括开发用于α-PbO薄膜的生长工艺,以及其作为检测器材料的结构和性能表征。;由于我们打算将α-PbO用作光电导检测器,因此它应具有某些特性。光电导检测器由高电阻材料组成,其两端都带有电压偏置。它吸收入射的伽马射线,产生提供信号的电子-空穴对。为了发挥良好的功能,它必须具有高原子序数和高密度,才能通过光电效应吸收高能光子。它还应具有较大的电阻率和较宽的带隙,以避免在室温下产生较大的泄漏电流。最后,它必须具有良好的电荷载流子传输特性和检测器分辨率,以便能够确定辐射源的特征能量峰。我们选择alpha-PbO是因为它具有非常高的Z和非常高的密度,并且带隙在正确的范围内。它也有作为光电导体使用的悠久历史,其历史可追溯到1950年代。;已经使用了许多方法来生长α-PbO薄膜。然而,那些薄膜很少是单相或高度取向的。脉冲激光沉积提供了一种生长α-PbO外延薄膜的方法。使用X射线衍射2θ-o扫描,摇摆曲线和相互空间映射来表征生长的膜的结构。通过对结构表征进行参数化研究的反馈,可以优化生长过程以改善薄膜的质量。用于α-PbO薄膜光学测量的方法包括吸收光谱法和椭圆偏振法。光谱吸收系数的确定是通过PerkinElmer Lambda 950紫外可见分光光度计通过透射光谱法和反射光谱法实现的;研究α-PbO的电子和传输性质对于了解材料如何表现为辐射至关重要测量光谱光电导率,以确保α-PbO对光的响应足够大,以使其成为有用的检测器材料并确认带隙测量。;在检测器材料领域,通常使用互变产物作为品质因数,因为它可以测量检测器内电荷载流子的俘获长度。 Many's方程是光电流相对于宽带隙半导体两端施加电压的推导,是用于确定互积的方法之一。在0.5 V至80 V范围内获得光电流电压测量值。在整个范围内,这些数据很难与Many方程拟合。由于接触效应,较高的电压显示出与理想行为的偏离,但是在较低的电压下,数据不受影响。适合0.5 V至10 V的较低电压范围,产生的mutau = 6.8 x 10-4 cm2 / V。室温光电导体最终将用于检测伽玛射线;然而,薄膜没有足够的阻止能力来吸收伽马射线的总能量。因此,我们研究了α-PbO检测器对以α粒子形式出现的辐射的响应,因为它们很大,带电并且相对容易停止。 SRIM计算估计,α-PbO中的α粒子范围最大为16微米。最初长时间的薄膜生长会产生约8微米厚的薄膜。因此,在α-PbO中看不到来自α颗粒的完整能量峰。由于在α粒子逃逸检测器体积之前产生的电荷载流子,我们确实看到了一个肩膀从噪声峰中伸出。 (摘要由UMI缩短。)。

著录项

  • 作者

    Ford, Erin Leigh.;

  • 作者单位

    University of California, Berkeley.;

  • 授予单位 University of California, Berkeley.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2014
  • 页码 100 p.
  • 总页数 100
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号