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Cross-Layer Approaches for Monitoring, Margining and Mitigation of Circuit Variability.

机译:监视,保证和缓解电路可变性的跨层方法。

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摘要

With technology scaling, circuit performance has become more sensitive to various sources of variability, including manufacturing variations, ambient fluctuations, and circuit wear-out. These increased variations have created new challenges for conventional hardware guardbanding, as the additional design margin diminishes the benefits of technology scaling. This dissertation aims at reducing total system design margin with cross-layer approaches on monitoring, margining and mitigation of circuit variability.;Since hardware and software adaptation can be used to reduce design margin with the exposed hardware variability provided by hardware monitors, we start by proposing two different types of performance monitors that can achieve better monitoring accuracy and smaller monitoring overhead. We also demonstrate the use of these performance monitors in system adaptation with our end-to-end implementation of software testbeds.;We also study the dynamic variations and reliability margining problem in presence of monitor-and-actuate adaptation and emerging system contexts. In a system with monitor-and-actuate adaptation, dynamic variations require extra margin for monitor and actuate latencies. We analyze and study the margining problem considering different choices of the monitor and actuator types. System reliability margining strategies are also proposed for circuits in the "dark silicon" era, where the low-level design margin should consider the contexts of high-level power/thermal constraints.;Last, we propose a clock gating methodology to mitigate the aging induced clock skew, which is difficult to monitor and resolve through adaptation. For certain phenomena and variation sources, for example, soft error rates at different location/altitude, we also propose system/cloud-based monitors. An emulation platform is built to study the impacts of dynamic power management schemes on system reliability.
机译:随着技术的发展,电路性能对各种可变性因素变得更加敏感,包括制造差异,环境波动和电路磨损。这些增加的变化为传统的硬件保护带提出了新的挑战,因为额外的设计余量减少了技术扩展的好处。本文旨在通过跨层的方法来减少,减少和监测电路可变性,从而降低系统的总体设计裕度。由于硬件和软件的自适应可以减少硬件监控器提供的暴露的硬件可变性,从而降低了设计裕度。提出了两种不同类型的性能监视器,它们可以实现更好的监视精度和较小的监视开销。我们还通过端到端的软件测试平台实施来演示在系统适应中使用这些性能监视器的方法;我们还研究了在存在监视和执行适应以及新兴系统环境的情况下的动态变化和可靠性裕量问题。在具有监视和执行适应的系统中,动态变化需要额外的余量来监视和执行延迟。考虑到监视器和执行器类型的不同选择,我们分析并研究了保证金问题。还为“黑硅”时代的电路提出了系统可靠性裕度策略,在该技术中,低级设计裕度应考虑高级功率/热约束的情况。最后,我们提出了一种时钟门控方法以减轻老化导致时钟偏斜,很难通过自适应来监视和解决。对于某些现象和变化源,例如,不同位置/高度的软错误率,我们还建议使用基于系统/云的监视器。建立了一个仿真平台来研究动态电源管理方案对系统可靠性的影响。

著录项

  • 作者

    Lai, Liangzhen.;

  • 作者单位

    University of California, Los Angeles.;

  • 授予单位 University of California, Los Angeles.;
  • 学科 Electrical engineering.
  • 学位 Ph.D.
  • 年度 2015
  • 页码 176 p.
  • 总页数 176
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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