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Low frequency critical current noise and two level system defects in Josephson junctions.

机译:约瑟夫逊结中的低频临界电流噪声和二级系统缺陷。

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摘要

The critical current in a Josephson junction is known to exhibit a 1/falpha low frequency noise. Implemented as a superconducting qubit, this low frequency noise can lead to decoherence. While the 1/f noise has been known to arise from an ensemble of two level systems connected to the tunnel barrier, the precise microscopic nature of these TLSs remain a mystery.;In this thesis we will present measurements of the 1/f alpha low frequency noise in the critical current and tunneling resistance of Al-AlOx-Al Josephson junctions. Measurements in a wide range of resistively shunted and unshunted junctions confirm the equality of critical current and tunneling resistance noise. That is the critical current fluctuation corresponds to fluctuations of the tunneling resistance. In not too small Al-AlOx-Al junctions we have found that the fractional power spectral density scales linearly with temperature.;We confirmed that the 1/falpha power spectrum is the result of a large number of two level systems modulating the tunneling resistance. At small junction areas and low temperatures, the number of thermally active TLSs is insufficient to integrate out a featureless 1/ f spectral shape. By analyzing the spectral variance in small junction areas, we have been able to deduce the TLS defect density, n ≈ 2.53 per micrometer squared per Kelvin spread in the TLS energy per factor e in the TLS lifetimes. This density is consistent with the density of tunneling TLSs found in glassy insulators, as well as the density deduced from coherent TLSs interacting at qubit frequencies. The deduced TLS density combined with the magnitude of the 1/f power spectral density in large area junctions, gives an average TLS effective area, A ∼ 0.3 nanometer squared.;In ultra small tunnel junctions, we have studied the time-domain dynamics of isolated TLSs. We have found a TLS whose dynamics is described by the quantum tunneling between the two localized wells, and a one-phonon absorption/emission switching rate. From the quantum limiting rate and the WKB approximation, we estimated that the TLS has a mass and tunneling distance product consistent with an atomic mass tunneling through crystal lattice distances. At higher temperatures TLSs have been found that obey a simple thermal activation dynamics.;By analyzing the TLS response to an external electric field, we have deduced that the TLS electric dipole is in the order of, P ∼ 1 electron-Angstrom, consistent with the TLS having the charge of one electron tunneling through a disorder potential of distances, d ∼ 1 Angstrom.
机译:已知约瑟夫森结中的临界电流表现出1 / falpha低频噪声。实现为超导量子位的这种低频噪声会导致退相干。虽然已知1 / f噪声是由与隧道屏障相连的两级系统的整体产生的,但这些TLS的精确微观性质仍然是个谜。;在本文中,我们将介绍1 / f alpha低的测量结果。 Al-AlOx-Al Josephson结的临界电流和隧穿电阻中的频率噪声。在广泛的电阻分流和非分流结中进行的测量证实了临界电流和隧穿电阻噪声相等。即,临界电流波动对应于隧穿电阻的波动。在不太小的Al-AlOx-Al结中,我们发现分数功率谱密度与温度成线性比例关系;我们确认1 / falpha功率谱是大量两级系统调节隧穿电阻的结果。在小结区和低温下,热活性TLS的数量不足以整合出无特征的1 / f光谱形状。通过分析小结区域的光谱变化,我们已经可以得出TLS缺陷密度n≈。在TLS寿命中,每因子e的TLS能量中的每开尔文散度每平方微米为2.53。该密度与在玻璃状绝缘子中发现的隧道TLS的密度以及从以量子比特频率相互作用的相干TLS推论的密度一致。推导的TLS密度与大面积路口的1 / f功率谱密度的大小相结合,得出平均TLS有效面积A约为0.3纳米平方;在超小型隧道路口中,我们研究了时空动力学隔离的TLS。我们发现了一个TLS,其动态性由两个局部阱之间的量子隧穿和一个声子吸收/发射转换速率来描述。从量子极限速率和WKB近似值,我们估计TLS具有与通过晶格距离隧穿的原子质量一致的质量和隧穿距离乘积。在较高的温度下,已经发现TLS遵循简单的热活化动力学。通过分析TLS对外部电场的响应,我们推断出TLS电偶极的数量级为P〜1电子埃,与TLS带有一个电子,其电荷通过距离d〜1埃的无序电势隧穿。

著录项

  • 作者单位

    University of Illinois at Urbana-Champaign.;

  • 授予单位 University of Illinois at Urbana-Champaign.;
  • 学科 Condensed matter physics.;Low temperature physics.;Nanoscience.
  • 学位 Ph.D.
  • 年度 2015
  • 页码 160 p.
  • 总页数 160
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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