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DEVELOPMENTS AND APPLICATIONS OF QUANTITATIVE SURFACE ANALYSIS BY ION MICROSCOPY (ALUMINUM, ZINC).

机译:离子显微镜(铝,锌)定量表面分析的研究与应用。

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摘要

Secondary ion mass spectrometry (SIMS) is used to study the surface and in-depth composition of solid materials. The methodology of SIMS and some important analytical parameters are studied. Instrumental developments concerning automation of data acquisition and processing are performed. A microcomputer using CAMAC as an interface is implemented on the CAMECA IMS-300 ion analyzer. The development of hardware and software results in a versatile and user-friendly system.; The different methods described in literature for quantisation of SIMS need support from the use of well-certified standard materials in the calibration procedure. Secondary ion micro-analysis is thus used to investigate the homogeneity (at the microlevel) of a number of standard reference materials. The sampling constant concept is applied in order to evaluate the applicability of reference materials for microprobe analysis. The degree of heterogeneity is estimated and the number of replicate analyses required for achieving a desired precision is calculated.; The Matrix Ion Species Ratio (MISR) method is used for the quantitative SIMS analysis at trace element levels in metallic matrices. A comparison is made between the results of the MISR method for quantification of SIMS data and spark source mass spectrometric analysis. For the matrix constituents at high concentration levels and for alloy systems, quantitative SIMS is hampered by large variations in the secondary ion yield as a function of the matrix composition. These matrix effects are studied for a Al-Zn binary alloy system, which is used as a coating on steel wire. Relative ionisation coefficients of Al and Zn sputtered from the alloys, are measured as a function of the solute element concentration.; The method then is applied to the determination of the aluminum and zinc concentrations in different phases of a 55 w. % Al-Zn alloy coating on steel wire. The surface and in-depth composition of the overlayer are studied. Also, SIMS analyses are performed of Al-Zn coated wire samples, which were exposed for a 3.5 year period to a rural and marine environment. In this way the identification of corrosion products and the assessment of the influence of the atmospheric environment is performed.; SIMS is then used to the study of an environmental problem: the quantitative analysis of electric steel furnace dust particles and the determination of the enrichment of various elements at the surface of these dust particles.
机译:二次离子质谱(SIMS)用于研究固体材料的表面和深度成分。研究了SIMS的方法和一些重要的分析参数。进行了有关数据采集和处理自动化的工具开发。在CAMECA IMS-300离子分析仪上实现了使用CAMAC作为接口的微型计算机。硬件和软件的开发导致了一个通用且用户友好的系统。文献中描述的用于SIMS量化的不同方法需要校准过程中使用经过良好认证的标准材料来提供支持。因此,二次离子微分析被用于研究许多标准参考物质的均一性(在微观水平上)。应用采样常数概念是为了评估参考材料在微探针分析中的适用性。估计异质性程度,并计算实现所需精度所需的重复分析次数。基质离子物种比率(MISR)方法用于金属基质中痕量元素水平的定量SIMS分析。比较了用于定量SIMS数据的MISR方法的结果与火花源质谱分析的结果。对于高浓度水平的基体成分和合金系统,二次离子产率随基体组成的变化而变化,不利于定量SIMS。对于Al-Zn二元合金体系(用作钢丝上的涂层),研究了这些基体效应。测量从合金溅射出的铝和锌的相对电离系数,作为溶质元素浓度的函数。然后将该方法用于测定55 w的不同相中的铝和锌浓度。 %钢丝上的Al-Zn合金涂层。研究了覆盖层的表面和深度组成。而且,对铝锌镀层的线材样品进行了SIMS分析,这些样品在农村和海洋环境中暴露了3.5年。以这种方式进行腐蚀产物的鉴定和对大气环境影响的评估。然后,SIMS用于研究环境问题:电钢炉粉尘颗粒的定量分析以及这些粉尘颗粒表面各种元素的富集测定。

著录项

  • 作者

    VAN CRAEN, MARC JOZEF ANNA.;

  • 作者单位

    Universitaire Instelling Antwerpen (Belgium).;

  • 授予单位 Universitaire Instelling Antwerpen (Belgium).;
  • 学科 Chemistry Analytical.
  • 学位 Dr.
  • 年度 1982
  • 页码 242 p.
  • 总页数 242
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学;
  • 关键词

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