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Electronic properties of noble metal surfaces and ultrathin metal films on noble metal substrates.

机译:贵金属基材上的贵金属表面和超薄金属膜的电子性能。

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摘要

Auger-Photoelectron Coincidence Spectroscopy (APECS) was used to examine the electronic structure of elemental Ag and the Ag/Cu(100) and Pd/Cu(100) surface alloys. Using APECS, the intrinsic shape of Auger lines can be determined. APECS data for the elemental Ag M 5VV and M4VV Auger lines were modeled using a many-body theory developed by Cini and Sawatzky, and the fit to the model indicates that the hole-hole correlation energy of the 1G4 Auger final state is 4.8 +/- 0.1 eV.; For the Ag/Cu(100) and Pd/Cu(100) surface alloys, we examined the M5VV Auger line as a proxy for directly measuring the valence d-bands of Ag and Pd. The valence d-bands of the Ag and Pd impurities are predicted to shift away from the Fermi level (EF) by 0.7 eV and 0.64 eV, respectively, for an impurity incorporated into the first layer of the Cu lattice. These d-band shifts should manifest themselves as a shift of Auger peaks to lower kinetic energy. We observe a small shift of 0.25 eV in the Ag M5VV Auger line. In contrast, Pd exhibits a much larger shift of ∼ 1 eV.; We also examined the inverse photoemission spectra of Cs/Cu(100) and Cs/Cu(111). For low coverages, a Cs-induced state appears at 0.29 eV above EF and this feature moves towards EF with increasing Cs coverage. The orbital character of the Cs-induced state is d-like when in a projected band gap of the substrate and s, p-like when degenerate with a projected bulk band of the Cu host. A novel aspect of orbital hybridization is proposed to explain these observations.; We also report on the first angle-resolved APECS (AR-APECS) measurements from a solid. The angular distribution of L3 VV Auger electrons from the Cu(111) surface was measured in time coincidence with emission from Cu 2p3/2 core level. Significant dissimilarities in the coincidence pattern are apparent when the 2 p3/2 level is at a photoelectron diffraction (PED) maximum vs. when the core level is off maximum. The AR-APECS technique may be sampling different scattering sites on and off the PED maxima, or the technique may be sensitive to differences between lattice-like and atomic-like effects.
机译:俄歇光电子符合光谱法(APECS)用于检查元素Ag以及Ag / Cu(100)和Pd / Cu(100)表面合金的电子结构。使用APECS,可以确定俄歇线的固有形状。用Cini和Sawatzky开发的多体理论对Ag Ag 5VV和M4VV Muger线的APECS数据进行建模,对模型的拟合表明1G4 Auger最终状态的孔洞相关能为4.8 + / -0.1 eV .;对于Ag / Cu(100)和Pd / Cu(100)表面合金,我们检查了M5VV Auger线作为直接测量Ag和Pd价d波段的代理。对于掺入铜晶格第一层的杂质,Ag和Pd杂质的价d带预计分别偏离费米能级(EF)0.7 eV和0.64 eV。这些d波段位移应表现为俄歇峰位移以降低动能。我们在Ag M5VV俄歇线中观察到0.25 eV的微小偏移。相比之下,Pd的位移大得多,约为1 eV。我们还检查了Cs / Cu(100)和Cs / Cu(111)的反光发射光谱。对于低覆盖率,Cs诱导的状态出现在EF之上0.29 eV处,并且此功能随着Cs覆盖率的增加而趋向EF。 Cs诱导态的轨道特性在底物的投影带隙中为d形,而在Cu主体的投影体带发生简并时则为s,呈p形。提出了轨道杂交的一个新方面来解释这些观察结果。我们还报告了来自固体的首次角度分辨APECS(AR-APECS)测量。从Cu(111)表面测量的L3 VV Auger电子的角分布与Cu 2p3 / 2核心能级的发射在时间上一致。当2 p3 / 2能级最大为光电子衍射(PED)时,与核心能级最大时相比,重合模式中的明显差异是显而易见的。 AR-APECS技术可能会在PED最大值上或下对不同的散射点进行采样,或者该技术可能对晶格效应和原子样效应之间的差异敏感。

著录项

  • 作者

    Arena, Dario Alejandro.;

  • 作者单位

    Rutgers The State University of New Jersey - New Brunswick.;

  • 授予单位 Rutgers The State University of New Jersey - New Brunswick.;
  • 学科 Physics Condensed Matter.
  • 学位 Ph.D.
  • 年度 2000
  • 页码 217 p.
  • 总页数 217
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:47:50

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