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The effect of partial crystallization on phase-change optical storage.

机译:部分结晶对相变光存储的影响。

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摘要

The degree of partial crystallization of phase change materials for rewritable optical data storage is shown to affect the subsequent formation of amorphous marks. Experiments with Ge2Sb2.5Te5 (GST) and AgInSbTe (AIST) phase-change materials demonstrate the difference between nucleation-dominated and growth-dominated processes in the uniformity of crystalline states and in the subsequent formation of amorphous marks. For the GST material, experimental measurements along with thermal and optical modeling show that the reduced reflectivity and increased absorption of the partially crystalline state increases the final amorphous mark size. An 8% decrease in reflectivity and a 11% increase in mark diameter is measured between the amorphous marks formed in the fully crystallized, high reflectivity (R = 43%) state and partially crystallized, low reflectivity (R = 30%) state. In contrast, the AIST material, which is growth-dominated, does not crystallize uniformly at reflectivity levels below full crystallization. This is shown to result in a mixture of amorphous and crystalline regions rather than a partially crystalline state. Further, the final amorphous mark size does not have the inverse relation with initial reflectivity measured and modeled for the GST material.; Novel reflectivity measurements and images of amorphous state marks are completed by combining Photon Tunneling Microscopy (PTM) with technology for microscope testing of optical disks. Reflectivity measurements of amorphous marks between 200 nm and 500 nm are made with a 680-nm laser diode to a first-surface GST phase-change disk. A two-laser static tester provides measurements of the change in reflectivity during the write process. The effect of air gap on the coupling of propagating and evanescent waves is measured. A PTM with an effective numerical aperture of 1.4 and blue illumination at 435.8 nm is used to image amorphous marks with a resolution of 190 nm. The reflectivity measurements and images are used to demonstrate the inverse dependence between the initial reflectivity and the final amorphous mark size for a nucleation-dominated GST phase-change optical recording disk.
机译:用于可重写光学数据存储的相变材料的部分结晶程度显示出会影响非晶标记的后续形成。用Ge 2 Sb 2.5 Te 5 (GST)和AgInSbTe(AIST)相变材料进行的实验证明了成核作用与生长之间的区别在晶体状态的均匀性和随后形成非晶标记中的主要过程。对于GST材料,实验测量以及热和光学建模表明,降低的反射率和对部分结晶态吸收的增加会增加最终非晶标记的尺寸。在完全结晶的高反射率(R = 43%)状态和部分结晶的低反射率(R = 30%)状态下形成的非晶标记之间,反射率降低了8%,标记直径增加了11%。相反,生长主导的AIST材料在低于完全结晶的反射率水平下不会均匀结晶。已显示这导致非晶和结晶区域的混合,而不是部分结晶的状态。此外,最终的无定形标记尺寸与针对GST材料测量和建模的初始反射率没有反比关系。通过将光子隧穿显微镜(PTM)与用于光盘的显微镜测试技术相结合,可以完成新颖的反射率测量和非晶态标记图像。用680 nm激光二极管对第一表面GST相变盘进行200 nm至500 nm之间非晶标记的反射率测量。两激光静态测试仪可测量写入过程中反射率的变化。测量了气隙对传播波与e逝波耦合的影响。具有1.4的有效数值孔径和435.8 nm的蓝色照明的PTM用于成像分辨率为190 nm的非晶标记。反射率测量结果和图像用于证明成核占主导地位的GST相变光记录盘的初始反射率和最终非晶标记大小之间的反相关关系。

著录项

  • 作者

    Nelson, Kenric P.;

  • 作者单位

    Boston University.;

  • 授予单位 Boston University.;
  • 学科 Engineering Electronics and Electrical.; Physics Optics.
  • 学位 Ph.D.
  • 年度 2001
  • 页码 66 p.
  • 总页数 66
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;光学;
  • 关键词

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