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Determination of intrinsic film properties from nanoindentation of film/substrate composites.

机译:从膜/基材复合材料的纳米压痕确定固有的膜性能。

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摘要

Determination of the mechanical properties of thin films on substrates by indentation has always been a problem because of the influence of the substrate on measured properties. The objective of the research described in this dissertation was to study the effect of substrate properties on the measurement of film properties by nanoindentation and to develop methods for extracting the intrinsic film properties from nanoindentation experiments.; Aluminum films and tungsten films with thicknesses varying from 0.5 μm to 2.0 μm were sputter deposited onto aluminum, glass, silicon, and sapphire substrates. Hardness and elastic modulus were first determined using the well-established Oliver-Pharr method. The Al films have a hardness of 0.6 GPa and a modulus of 65 GPa and the W films have a hardness of 13–14 GPa and a modulus of 400–440 GPa at small indentation depths. However, due to limitations in the Oliver-Pharr method, these measurements showed significant deviations from the expected value, especially at large indentation depths relative to the film thickness.; The true or intrinsic hardness of the Al films on glass and the W films on sapphire can be determined by utilizing the elastic homogeneity of the film and substrate and the P/S2 parameter, where P is the load and S is the contact stiffness. Two other hardness models, the Tsui-Pharr model and the Korsunsky model, were examined using the Al and W data. Finite element methods were also used to model the indentation response of the film/substrate system. The model permitted an estimate of the intrinsic film properties.; A model developed by King has been used to extract the intrinsic modulus of the films from the composite data. Although King developed the method for a flat punch indenting an elastic half space, his model works reasonably well for indentations made with the three-faced Berkovich indenter. A simple model for calculating pile-up height from the nanoindentation data is also presented. The pile-up height predicted by the model is compared with measurements made with AFM and found to agree reasonably well.
机译:由于压痕对基材的测量性能的影响,通过压痕确定薄膜在基材上的机械性能一直是一个难题。本文的研究目的是研究基底性能对纳米压痕法测量薄膜性能的影响,并开发从纳米压痕实验中提取薄膜固有性能的方法。将厚度从0.5μm到2.0μm的铝膜和钨膜溅射沉积在铝,玻璃,硅和蓝宝石衬底上。首先使用公认的Oliver-Pharr方法确定硬度和弹性模量。在小压痕深度下,Al膜的硬度为0.6 GPa,模量为65 GPa,W膜的硬度为13–14 GPa,模量为400–440 GPa。但是,由于Oliver-Pharr方法的局限性,这些测量结果显示出与预期值的显着偏差,尤其是在相对于膜厚的较大压痕深度处。玻璃上的Al膜和蓝宝石上的W膜的真实或固有硬度可以通过利用膜和基底的弹性均匀性以及P / S 2 参数来确定,其中P是载荷S是接触刚度。使用Al和W数据检查了另外两个硬度模型Tsui-Pharr模型和Korsunsky模型。有限元方法也用于模拟薄膜/基材系统的压痕响应。该模型可以估计薄膜的固有特性。 King开发的模型已用于从复合数据中提取薄膜的固有模量。尽管King开发出了一种用于平冲头压入弹性半空间的方法,但他的模型对于用三面式Berkovich压头制作的压痕相当有效。还提出了一种用于从纳米压痕数据计算堆积高度的简单模型。将模型预测的堆积高度与AFM进行的测量进行比较,发现合理吻合。

著录项

  • 作者

    Saha, Ranjana.;

  • 作者单位

    Stanford University.;

  • 授予单位 Stanford University.;
  • 学科 Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2001
  • 页码 106 p.
  • 总页数 106
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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