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Investigations of nonmetal charge transfer using helium microwave -induced plasma time of flight mass spectrometry.

机译:使用氦微波诱导的等离子体飞行时间质谱研究非金属电荷转移。

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摘要

In helium microwave induced plasmas (He-MIP), the +1 ion emission lines are more intense for most nonmetals than the atom emission lines. The most likely reason for this behavior is charge transfer (CT) between the helium ion and the neutral ground state nonmetal, producing an excited state nonmetal ion. The proposed mechanism is given in the following equation: He+24.56eV +A°0eV →He°0e V+A+*24.56 eV±DE A represents the analyte, ° and + indicate the ionization states, and * indicates an electronically excited state. ΔE is the difference between 24.56 eV and the excited ionization energy of the nonmetal.;The CT phenomenon with nonmetals in He-MIP was studied using atomic emission spectrometry (AES). AES gives information about populations of specific atom and ion electronic states. On the other hand, mass spectrometry monitors the entire population of ion states. Using results from these techniques, a more complete picture of charge transfer and nonmetal ionization processes can be produced.;To examine this mechanism, the helium ion population was reduced by adding a more easily ionized gas to the plasma. The addition of 0.5% Ar to the plasma decreases the intensity of the Cl+* emission line by 60%, while the Cl atom line signal increases by a factor of 20.;In this work, a time of flight mass spectrometer was constructed and used to monitor the total chlorine ion signal. Upon addition of 0.8% Ar, the chlorine total ion signal decreased 63%. A chemical kinetics simulator was also used in these studies to model the plasma kinetics. Results, based upon the CT model, match the experiment well. It was only possible to achieve agreement with experimental results using 8 reactions for chlorine. Similar results were obtained for bromine.;The simulations verified that CT is the dominant mechanism for nonmetal ionization in a helium plasma. In the course of modeling the behaviors of the atoms; additional plasma chemistry was clarified. An argon metastable state appears to be responsible for excitation of the monitored Cl atom line.
机译:在氦微波感应等离子体(He-MIP)中,大多数非金属的+1离子发射线比原子发射线更强。此行为的最可能原因是氦离子与中性基态非金属之间发生电荷转移(CT),从而产生激发态非金属离子。拟议的机理由以下方程式给出:He + 24.56eV + A°0eV→He°0e V + A +* 24.56 eV±DE A表示分析物,°和+表示电离态,*表示电子兴奋的状态。 ΔE是24.56 eV与非金属的激发电离能之间的差。;使用原子发射光谱法(AES)研究了He-MIP中非金属的CT现象。 AES提供有关特定原子和离子电子态总体的信息。另一方面,质谱仪监视整个离子态。使用这些技术的结果,可以得出更完整的电荷转移和非金属电离过程的图像。为了检查这种机理,通过向等离子体中添加更容易电离的气体减少了氦离子的数量。向等离子体中添加0.5%Ar会使Cl + *发射谱线的强度降低60%,而Cl原子谱线信号的强度增加20倍。;在这项工作中,构造并使用了飞行时间质谱仪监视总氯离子信号。加入0.8%的Ar后,氯总离子信号降低了63%。在这些研究中还使用了化学动力学模拟器来模拟等离子体动力学。基于CT模型的结果与实验非常吻合。使用8个氯气反应只能与实验结果达成一致。对于溴也获得了相似的结果。模拟表明,CT是氦等离子体中非金属离子化的主要机理。在模拟原子行为的过程中;澄清了其他等离子体化学。氩亚稳态似乎是引起所监测的Cl原子线激发的原因。

著录项

  • 作者

    Keating, Pamela Rose.;

  • 作者单位

    Northern Illinois University.;

  • 授予单位 Northern Illinois University.;
  • 学科 Chemistry Analytical.
  • 学位 Ph.D.
  • 年度 2001
  • 页码 107 p.
  • 总页数 107
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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