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High-voltage measurement using the quadrature method and permittivity-shielding.

机译:使用正交法和介电常数屏蔽的高压测量。

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摘要

Using extensive finite element modeling, the quadrature method and permittivity-shielding for measuring high voltage using electric field sensors were developed.; The quadrature method is a technique that determines the necessary number of sensors that make point-like measurements of the field and the best positioning and weighting of those sensors for any chosen electrode geometry, for a given worst-case field perturbation due to external changes in the field (stray field effects), and for a particular minimum accuracy requirement. As a result, electrodes can be positioned much farther apart for a given number of sensors than was previously known to be possible, which results in lower field stresses in and around the electrodes requiring less insulation than was otherwise possible.; Permittivity-shielding is a technique that offers an alternative to metallic shielding for the purpose of isolating electric field measurements from stray field effects. Materials with high dielectric constants, high-enough conductivities, or both supply the shielding by filling a space spanning from one electrode to the other and shield the field inside and nearby that space. With permittivity-shielding, electrodes are not required to be in close proximity with one another, avoiding the need for any special insulation. This kind of shielding also has the added benefit of moderating the field between the electrodes.; 138 kV, 230 kV, and 345 kV optical voltage transducers (OVTs) each using three optical field sensors according to the quadrature method were constructed and tested. They meet the highest IEC and ANSI/IEEE accuracy requirements for instrument transformers even in the presence of substation-like changes in local geometry, such as the movement or installation of neighboring equipment. The 138 kV and 345 kV OVTs also use off-the-shelf resistors to supply resistive permittivity-shielding, and they maintain accuracy in the presence of severe stray field effects, typically caused by the mixture of moisture and pollution on an OVT's surface.; These OVTs offer all the inherent advantages of optical sensor technologies but are simpler and safer in design than other OVTs. Their basic structure consists of an off-the-shelf insulator, three small optical field sensors, and possibly resistors (for resistive shielding).
机译:利用广泛的有限元建模,开发了使用电场传感器测量高压的正交方法和介电常数屏蔽技术。正交方法是一种技术,该技术可确定在任何给定的最坏情况下由于外部变化引起的场扰动下,对场进行点状测量的传感器的数量,以及对于任何选定的电极几何形状,这些传感器的最佳定位和权重。场(杂散场效应),以及特定的最低精度要求。结果,对于给定数量的传感器,电极可以被定位成比以前已知的可能相距更远,这导致电极内部和周围的电场应力更低,所需的绝缘性要比其他情况低。介电常数屏蔽是一种技术,可将金属测量结果与杂散场效应隔离开,从而替代金属屏蔽层。具有高介电常数,高电导率或同时具有两者的材料通过填充从一个电极到另一个电极的空间并屏蔽该空间内部和附近的电场来提供屏蔽。使用介电常数屏蔽,不需要电极彼此紧密靠近,从而避免了任何特殊的绝缘。这种屏蔽还具有减轻电极之间电场的附加好处。分别构造并测试了分别使用三个光场传感器根据正交方法构建的138 ​​kV,230 kV和345 kV光电压传感器(OVT)。即使在变电站般的局部几何形状变化(例如相邻设备的移动或安装)的情况下,它们也符合仪表变压器的最高IEC和ANSI / IEEE精度要求。 138 kV和345 kV OVT还使用现成的电阻器来提供电阻率屏蔽,并且在存在严重杂散场效应(通常由OVT表面上的水分和污染的混合物引起)的情况下,它们可以保持精度。这些OVT提供了光学传感器技术的所有固有优势,但在设计上比其他OVT更简单,更安全。它们的基本结构包括一个现成的绝缘体,三个小型光学场传感器以及可能的电阻器(用于电阻屏蔽)。

著录项

  • 作者

    Chavez, Patrick Pablo.;

  • 作者单位

    The University of British Columbia (Canada).;

  • 授予单位 The University of British Columbia (Canada).;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2002
  • 页码 144 p.
  • 总页数 144
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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