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Analysis and Mitigation of SEU-induced Noise in FPGA-based DSP Systems.

机译:基于FPGA的DSP系统中SEU引起的噪声的分析和缓解。

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摘要

This dissertation studies the effects of radiation-induced single-event upsets (SEUs) on digital signal processing (DSP) systems designed for field-programmable gate arrays (FPGAs). It presents a novel method for evaluating the effects of radiation on DSP and digital communication systems. By using an application-specific measurement of performance in the presence of SEUs, this dissertation demonstrates that only 5--15% of SEUs affecting a communications receiver (i.e. 5--15% of sensitive SEUs) cause critical performance loss. It also reports that the most critical SEUs are those that affect the clock, global reset, and most significant bits (MSBs) of computation.;This dissertation also demonstrates reduced-precision redundancy (RPR) as an effective and efficient alternative to the popular triple modular redundancy (TMR) for FPGA-based communications systems. Fault injection experiments show that RPR can improve the failure rate of a communications system by over 20 times over the unmitigated system at a cost less than half that of TMR by focusing on the critical SEUs. This dissertation contrasts the cost and performance of three different variations of RPR, one of which is a novel variation developed here, and concludes that the variation referred to as "Threshold RPR" is superior to the others for FPGA systems. Finally, this dissertation presents several methods for applying Threshold RPR to a system with the goal of reducing mitigation cost and increasing the system performance in the presence of SEUs. Additional fault injection experiments show that optimizing the application of RPR can result in a decrease in critical SEUs by as much 65% at no additional hardware cost.;Keywords: FPGA, reliability, single-event upset, radiation effects, triple modular redundancy, reduced-precision redundancy, digital signal processing, digital communications
机译:本文研究了辐射诱发的单事件扰动(SEU)对为现场可编程门阵列(FPGA)设计的数字信号处理(DSP)系统的影响。它提出了一种评估辐射对DSP和数字通信系统影响的新颖方法。通过在存在SEU的情况下使用针对应用的性能测量,本论文表明,仅影响通信接收机的SEU的5--15%(即敏感SEU的5--15%)会导致严重的性能损失。报告还指出,最关键的SEU是那些影响时钟,全局复位和最高有效位(MSB)的SEU。本论文还论证了降低精度的冗余(RPR)作为流行的三元组的一种有效替代方案。基于FPGA的通信系统的模块化冗余(TMR)。故障注入实验表明,通过专注于关键的SEU,RPR可以将通信系统的故障率提高到20%以上,而成本却不到TMR的一半。本文对比了RPR的三种不同变体的成本和性能,其中一种是此处开发的新颖变体,并得出结论,称为“阈值RPR”的变体优于FPGA系统的其他变体。最后,本文提出了几种在系统中应用阈值RPR的方法,其目的是在SEU存在的情况下降低缓解成本并提高系统性能。额外的故障注入实验表明,优化RPR的应用可以在不增加硬件成本的情况下使关键SEU降低多达65%。关键词:FPGA,可靠性,单事件翻转,辐射效应,三重模块冗余,减少精度冗余,数字信号处理,数字通信

著录项

  • 作者

    Pratt, Brian H.;

  • 作者单位

    Brigham Young University.;

  • 授予单位 Brigham Young University.;
  • 学科 Engineering Computer.
  • 学位 Ph.D.
  • 年度 2011
  • 页码 221 p.
  • 总页数 221
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:45:10

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